EFFECT OF SILANE DILUTION ON INTRINSIC STRESS IN GLOW-DISCHARGE HYDROGENATED AMORPHOUS-SILICON FILMS

被引:63
作者
HARBISON, JP
WILLIAMS, AJ
LANG, DV
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D O I
10.1063/1.333148
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O59 [应用物理学];
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页码:946 / 951
页数:6
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共 35 条
[21]  
MOORE CE, 1971, NATL STAND REF DA 35, V2, P169
[22]  
MURBACH HP, 1954, P PHYS SOC B, V67, P497
[23]   STRUCTURE OF AMORPHOUS (GE,SI)1-XYX ALLOYS [J].
PHILLIPS, JC .
PHYSICAL REVIEW LETTERS, 1979, 42 (17) :1151-1154
[24]  
Polk D. E., 1971, Journal of Non-Crystalline Solids, V5, P365, DOI 10.1016/0022-3093(71)90038-X
[25]  
POSTOL TA, 1980, PHYS REV LETT, V45, P648, DOI 10.1103/PhysRevLett.45.648
[26]  
Priest J, 1962, VACUUM, V12, P301, DOI [10.1016/0042-207X(62)90182-3, DOI 10.1016/0042-207X(62)90182-3]
[27]   APPARATUS FOR MEASUREMENT OF STRESS IN VACUUM EVAPORATED FILMS [J].
PRIEST, JR .
REVIEW OF SCIENTIFIC INSTRUMENTS, 1961, 32 (12) :1349-+
[28]   PROTON MAGNETIC-RESONANCE SPECTRA OF PLASMA-DEPOSITED AMORPHOUS SI-H FILMS [J].
REIMER, JA ;
VAUGHAN, RW ;
KNIGHTS, JC .
PHYSICAL REVIEW LETTERS, 1980, 44 (03) :193-196
[29]  
SMAKULA A, 1959, METHODS EXPT PHYSICS, V6, P283