OPTIMUM ACCELERATED LIFE-TESTS FOR WEIBULL AND EXTREME VALUE DISTRIBUTIONS

被引：65
作者：
MEEKER, WQ
NELSON, W
机构：
[1] IOWA STATE UNIV,DEPT STATISTICS,SNEDECOR HALL,AMES,IA 50010
[2] GE,CORP RES & DEV 35 578,SCHENECTADY,NY 12345
来源：
IEEE TRANSACTIONS ON RELIABILITY | 1975年 / 24卷 / 05期
关键词：
D O I：
10.1109/TR.1975.5214922
中图分类号：
TP3 [计算技术、计算机技术];
学科分类号：
0812 ;
摘要：
引用
收藏
页码：321 / 332
页数：12
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