DETERMINATION OF THE SI(111) 1X1 STRUCTURE AT HIGH-TEMPERATURE BY REFLECTION HIGH-ENERGY ELECTRON-DIFFRACTION

被引：87

|

作者：

KOHMOTO, S

ICHIMIYA, A

机构：

来源：

SURFACE SCIENCE | 1989年 / 223卷 / 03期

关键词：

D O I：

10.1016/0039-6028(89)90669-9

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

引用

收藏

页码：400 / 412

页数：13

相关论文

共 50 条

[31] Temperature dependence of reflection high-energy electron diffraction intensity from Si(111)-7x7 superlattice
Yamaguchi, K
Mitsui, H
Shigeta, Y
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1997, 15 (05): : 2569 - 2573
[32] ANALYSIS OF REFLECTION HIGH-ENERGY ELECTRON-DIFFRACTION AZIMUTHAL PLOTS
MITURA, Z
MAKSYM, PA
PHYSICAL REVIEW LETTERS, 1993, 70 (19) : 2904 - 2907
[33] REFLECTION HIGH-ENERGY ELECTRON-DIFFRACTION STUDY OF THE GAASSIGAAS SYSTEM
FAHY, MR
ASHWIN, MJ
HARRIS, JJ
NEWMAN, RC
JOYCE, BA
APPLIED PHYSICS LETTERS, 1992, 61 (15) : 1805 - 1807
[34] REFLECTION HIGH-ENERGY ELECTRON-DIFFRACTION FROM STEPPED SURFACES
HOLLOWAY, S
PHYSICS LETTERS A, 1979, 71 (5-6) : 476 - 480
[35] REFLECTION HIGH-ENERGY ELECTRON-DIFFRACTION FROM AN ADSORBED MONOLAYER
HOLLOWAY, S
PHYSICS LETTERS A, 1979, 71 (5-6) : 481 - 485
[36] A DIFFERENTIAL REFLECTION HIGH-ENERGY ELECTRON-DIFFRACTION MEASUREMENT SYSTEM
CHANG, CE
CHIN, TP
TU, CW
REVIEW OF SCIENTIFIC INSTRUMENTS, 1991, 62 (03): : 655 - 659
[37] REFLECTION HIGH-ENERGY ELECTRON-DIFFRACTION AND X-RAY STUDIES OF A1N FILMS GROWN ON SI(111) AND SI(001) BY ORGANOMETALLIC CHEMICAL VAPOR-DEPOSITION
CHUBACHI, Y
SATO, K
KOJIMA, K
THIN SOLID FILMS, 1984, 122 (03) : 259 - 270
[38] REFLECTION HIGH-ENERGY ELECTRON-DIFFRACTION PATTERNS OF CRSI2 FILMS ON (111) SILICON
MAHAN, JE
GEIB, KM
ROBINSON, GY
BAI, G
NICOLET, MA
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1991, 9 (01): : 64 - 68
[39] REFLECTION HIGH-ENERGY ELECTRON-DIFFRACTION INTENSITY OSCILLATION STUDY OF THE GROWTH OF GAAS ON GAAS(111)A
SATO, K
FAHY, MR
JOYCE, BA
SURFACE SCIENCE, 1994, 315 (1-2) : 105 - 111
[40] STUDY OF A SI(110) SURFACE BY USING REFLECTION HIGH-ENERGY ELECTRON-DIFFRACTION TOTAL-REFLECTION ANGLE X-RAY SPECTROSCOPY AND HIGH-TEMPERATURE SCANNING-TUNNELING-MICROSCOPY
YAMAMOTO, Y
SURFACE SCIENCE, 1994, 313 (1-2) : 155 - 167

← 1 2 3 4 5 →