DETERMINATION OF THE SI(111) 1X1 STRUCTURE AT HIGH-TEMPERATURE BY REFLECTION HIGH-ENERGY ELECTRON-DIFFRACTION

被引：87
作者：
KOHMOTO, S
ICHIMIYA, A
机构：
来源：
SURFACE SCIENCE | 1989年 / 223卷 / 03期
关键词：
D O I：
10.1016/0039-6028(89)90669-9
中图分类号：
O64 [物理化学（理论化学）、化学物理学];
学科分类号：
070304 ; 081704 ;
摘要：
引用
收藏
页码：400 / 412
页数：13
相关论文
共 36 条
[11]   BETHE CORRECTION METHOD FOR DYNAMICAL CALCULATION OF REFLECTION HIGH-ENERGY ELECTRON-DIFFRACTION INTENSITIES FROM GENERAL SURFACES [J].
ICHIMIYA, A .
ACTA CRYSTALLOGRAPHICA SECTION A, 1988, 44 :1042-1044
[12]  
ICHIMIYA A, 1987, SURF SCI, V192, pL893, DOI 10.1016/S0039-6028(87)81122-6
[13]   CORRECTION [J].
ICHIMIYA, A .
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1985, 24 (10) :1365-1365
[14]   MANY-BEAM CALCULATION OF REFLECTION HIGH-ENERGY ELECTRON-DIFFRACTION (RHEED) INTENSITIES BY THE MULTI-SLICE METHOD [J].
ICHIMIYA, A .
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1983, 22 (01) :176-180
[15]  
ICHIMIYA A, IN PRESS
[16]   SOME NEW TECHNIQUES IN REFLECTION HIGH-ENERGY ELECTRON-DIFFRACTION (RHEED) APPLICATION TO SURFACE-STRUCTURE STUDIES [J].
INO, S .
JAPANESE JOURNAL OF APPLIED PHYSICS, 1977, 16 (06) :891-908
[17]   DIFFUSE-SCATTERING IN THE HIGH-TEMPERATURE (1X1) STATE OF SI(111) [J].
IWASAKI, H ;
HASEGAWA, S ;
AKIZUKI, M ;
LI, ST ;
NAKAMURA, S ;
KANAMORI, J .
JOURNAL OF THE PHYSICAL SOCIETY OF JAPAN, 1987, 56 (10) :3425-3428
[18]   ATOMIC-STRUCTURE OF AN IMPURITY-STABILIZED SI[111] SURFACE - REFINEMENT USING A COMBINED-LAYER METHOD [J].
JEPSEN, DW ;
SHIH, HD ;
JONA, F ;
MARCUS, PM .
PHYSICAL REVIEW B, 1980, 22 (02) :814-824
[19]   REEXAMINATION OF THE STRUCTURE OF A LASER-STABILIZED SI(111)1X1 SURFACE [J].
JONA, F ;
MARCUS, PM ;
DAVIS, HL ;
NOONAN, JR .
PHYSICAL REVIEW B, 1986, 33 (06) :4005-4008
[20]   STRUCTURE OF THE LASER ANNEALED SI(111)-(1X1) SURFACE [J].
JONES, GJR ;
HOLLAND, BW .
SOLID STATE COMMUNICATIONS, 1985, 53 (01) :45-46
1234