THE OBSERVATION OF STACKING-FAULT TETRAHEDRA IN III-V COMPOUNDS

被引：7

作者：

DECOOMAN, BC ^{[1
]}

MCKERNAN, S ^{[1
]}

CARTER, CB ^{[1
]}

RALSTON, JR ^{[1
]}

WICKS, GW ^{[1
]}

EASTMAN, LF ^{[1
]}

机构：

[1] CORNELL UNIV,SCH ELECT ENGN,ITHACA,NY 14853

来源：

PHILOSOPHICAL MAGAZINE LETTERS | 1987年 / 56卷 / 03期

关键词：

ACKNOWLEDGMENT This work was supported by the Semiconductor Research Corporation; Micro-science and Technology Program and General Electric Co. s. McK. is supported by the Materials Science Center at Cornell. The electron microscopes are a Materials Science Center Facility and are funded; in part; by the NSF. The authors wish to thank R. Coles; M. Fabrizio and R. Cochran for technical assistance;

D O I：

10.1080/09500838708205254

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：85 / 90

页数：6

共 16 条

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