AUGER SIGNAL INTENSITY DEPENDENCE ON SURFACE-AREA (ROUGHNESS)

[1] DIRECT OBSERVATION OF SURFACE-PROFILE EFFECTS ON X-RAY-PHOTOELECTRON ANGULAR-DISTRIBUTIONS [J]. CHEMICAL PHYSICS LETTERS, 1975, 34 (01) : 49 - 54

[2] CONCENTRATION PROFILES FOR IRREGULAR SURFACES FROM X-RAY PHOTOELECTRON ANGULAR-DISTRIBUTIONS [J]. ANALYTICAL CHEMISTRY, 1976, 48 (06) : 843 - 846

[3] Adsorption of gases in multimolecular layers [J]. JOURNAL OF THE AMERICAN CHEMICAL SOCIETY, 1938, 60 : 309 - 319

[4] CHANG CC, 1974, CHARACTERIZATION SOL, P509

[5] Coburn J. W., 1974, Critical Reviews in Solid State Sciences, V4, P561, DOI 10.1080/10408437308245843

[6] SPUTTERING IN SURFACE ANALYSIS OF SOLIDS - DISCUSSION OF SOME PROBLEMS [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1976, 13 (05): : 1037 - 1044

[7] Ebel H., 1973, Journal of Electron Spectroscopy and Related Phenomena, V2, P277, DOI 10.1016/0368-2048(73)80020-9

[8] SURFACE ANALYSIS AND ANGULAR-DISTRIBUTIONS IN X-RAY PHOTOELECTRON-SPECTROSCOPY [J]. JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, 1974, 4 (02) : 93 - 137

[9] INSTRUMENTATION FOR SURFACE STUDIES - XPS ANGULAR-DISTRIBUTIONS [J]. JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, 1974, 5 (NOV-D) : 725 - 754

[10] DEPTH RESOLUTION AND SURFACE-ROUGHNESS EFFECTS IN SPUTTER PROFILING OF NICR MULTILAYER SANDWICH SAMPLES USING AUGER-ELECTRON SPECTROSCOPY [J]. THIN SOLID FILMS, 1977, 43 (03) : 275 - 283

[1] DIRECT OBSERVATION OF SURFACE-PROFILE EFFECTS ON X-RAY-PHOTOELECTRON ANGULAR-DISTRIBUTIONS [J]. CHEMICAL PHYSICS LETTERS, 1975, 34 (01) : 49 - 54

[2] CONCENTRATION PROFILES FOR IRREGULAR SURFACES FROM X-RAY PHOTOELECTRON ANGULAR-DISTRIBUTIONS [J]. ANALYTICAL CHEMISTRY, 1976, 48 (06) : 843 - 846

[3] Adsorption of gases in multimolecular layers [J]. JOURNAL OF THE AMERICAN CHEMICAL SOCIETY, 1938, 60 : 309 - 319

[4] CHANG CC, 1974, CHARACTERIZATION SOL, P509

[5] Coburn J. W., 1974, Critical Reviews in Solid State Sciences, V4, P561, DOI 10.1080/10408437308245843

[6] SPUTTERING IN SURFACE ANALYSIS OF SOLIDS - DISCUSSION OF SOME PROBLEMS [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1976, 13 (05): : 1037 - 1044

[7] Ebel H., 1973, Journal of Electron Spectroscopy and Related Phenomena, V2, P277, DOI 10.1016/0368-2048(73)80020-9

[8] SURFACE ANALYSIS AND ANGULAR-DISTRIBUTIONS IN X-RAY PHOTOELECTRON-SPECTROSCOPY [J]. JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, 1974, 4 (02) : 93 - 137

[9] INSTRUMENTATION FOR SURFACE STUDIES - XPS ANGULAR-DISTRIBUTIONS [J]. JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, 1974, 5 (NOV-D) : 725 - 754

[10] DEPTH RESOLUTION AND SURFACE-ROUGHNESS EFFECTS IN SPUTTER PROFILING OF NICR MULTILAYER SANDWICH SAMPLES USING AUGER-ELECTRON SPECTROSCOPY [J]. THIN SOLID FILMS, 1977, 43 (03) : 275 - 283