CONDUCTIVITY AND NOISE IN THIN-FILMS OF NONHYDROGENATED AMORPHOUS-SILICON IN THE HOPPING REGIME

被引：17
|
作者：
DAMICO, A [1 ]
FORTUNATO, G [1 ]
VANVLIET, CM [1 ]
机构：
[1] UNIV MONTREAL,CTR RECH MATH,MONTREAL H3C 3J7,QUEBEC,CANADA
来源：
SOLID-STATE ELECTRONICS | 1985年 / 28卷 / 08期
关键词：
D O I：
10.1016/0038-1101(85)90072-3
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
收藏
页码：837 / 844
页数：8
相关论文
共 50 条
  • [1] NOISE MEASUREMENTS IN THIN-FILMS OF AMORPHOUS-SILICON
    DAMICO, A
    FORTUNATO, G
    VANVLIET, CM
    JOURNAL OF NON-CRYSTALLINE SOLIDS, 1985, 77-8 : 499 - 502
  • [2] 1/F NOISE IN AMORPHOUS-SILICON AND HYDROGENATED AMORPHOUS-SILICON THIN-FILMS
    BACIOCCHI, M
    DAMICO, A
    VANVLIET, CM
    SOLID-STATE ELECTRONICS, 1991, 34 (12) : 1439 - 1447
  • [3] SURFACE AND BULK CONDUCTIVITY MEASUREMENTS ON AMORPHOUS-SILICON THIN-FILMS
    AIDA, MS
    BOUDJAADAR, S
    CHARI, A
    MAHDJOUBI, L
    THIN SOLID FILMS, 1992, 207 (1-2) : 1 - 3
  • [4] ACTIVATIONLESS HOPPING CONDUCTIVITY IN AMORPHOUS-SILICON NITRIDE FILMS
    ASADULLAYEV, NA
    CHUDINOV, SM
    CIRIC, I
    SOLID STATE COMMUNICATIONS, 1988, 66 (03) : 261 - 265
  • [5] PURITY CONSIDERATIONS FOR AMORPHOUS-SILICON THIN-FILMS
    DICKSON, CR
    FIESELMANN, BF
    OSWALD, RS
    JOURNAL OF CRYSTAL GROWTH, 1988, 89 (01) : 49 - 61
  • [6] PHOTOELECTROCHEMICAL MEASUREMENTS OF AMORPHOUS-SILICON THIN-FILMS
    HERRERO, J
    GUTIERREZ, MT
    ELECTROCHIMICA ACTA, 1991, 36 (5-6) : 915 - 920
  • [7] FORMATION OF NANOCRYSTALLITES IN AMORPHOUS-SILICON THIN-FILMS
    SCHOENFELD, O
    ZHAO, X
    HEMPEL, T
    BLAESING, J
    AOYAGI, Y
    SUGANO, T
    JOURNAL OF CRYSTAL GROWTH, 1994, 142 (1-2) : 268 - 270
  • [8] STRESS IN POLYCRYSTALLINE AND AMORPHOUS-SILICON THIN-FILMS
    HOWE, RT
    MULLER, RS
    JOURNAL OF APPLIED PHYSICS, 1983, 54 (08) : 4674 - 4675
  • [9] HOPPING CONDUCTIVITY DUE TO BIPOLARONS IN AMORPHOUS-SILICON NITRIDE FILMS
    ROIZIN, Y
    TSIBESKOV, L
    JOURNAL OF NON-CRYSTALLINE SOLIDS, 1991, 137 : 515 - 518
  • [10] CRYSTALLIZATION IN FLUORINATED AND HYDROGENATED AMORPHOUS-SILICON THIN-FILMS
    EDELMAN, F
    CYTERMANN, C
    BRENER, R
    EIZENBERG, M
    KHAIT, YL
    WEIL, R
    BEYER, W
    JOURNAL OF APPLIED PHYSICS, 1994, 75 (12) : 7875 - 7880
12345