CALCULATING THE EFFECTS OF LINEAR DEPENDENCIES IN M-SEQUENCES USED AS TEST STIMULI

被引：11

作者：

BARDELL, PH

机构：

[1] IBM Corporation, Poughkeepsie

来源：

IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS | 1992年 / 11卷 / 01期

关键词：

LINEAR DEPENDENCIES; LFSR; M-SEQUENCE; BIST;

D O I：

10.1109/43.108621

中图分类号：

TP3 [计算技术、计算机技术];

学科分类号：

0812 ;

摘要：

When pseudorandom patterns generated by a linear feedback shift register (LFSR) are used as test stimuli, there is always a concern about the linear dependencies within the sequence of patterns. It is possible for these linear dependencies to preclude a specific test pattern from being present in the sequence of applied patterns. These dependencies and ways to calculate their effects on a particular test are discussed in this note.

引用

页码：83 / 86

页数：4