RELIABILITY IMPROVEMENT OF BIPOLAR INTEGRATED-CIRCUITS THROUGH A CONTAMINATION REDUCTION

被引：0

作者：

RIMAUR, A ^{[1
]}

CASTILLO, C ^{[1
]}

DUCASSE, JP ^{[1
]}

PAGES, I ^{[1
]}

机构：

[1] MOTOROLA SEMICOND,TOULOUSE,FRANCE

来源：

JOURNAL OF ENVIRONMENTAL SCIENCES | 1985年 / 28卷 / 02期

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引用

页码：38 / 38

页数：1

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