RELIABILITY IMPROVEMENT OF BIPOLAR INTEGRATED-CIRCUITS THROUGH A CONTAMINATION REDUCTION

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作者：
RIMAUR, A [1 ]
CASTILLO, C [1 ]
DUCASSE, JP [1 ]
PAGES, I [1 ]
机构：
[1] MOTOROLA SEMICOND,TOULOUSE,FRANCE
来源：
JOURNAL OF ENVIRONMENTAL SCIENCES | 1985年 / 28卷 / 02期
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页码：38 / 38
页数：1
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