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- [8] APPLICATION OF FAULT FOLDING IN TEST-GENERATION FOR LOGIC-CIRCUITS - COMMENTS DIGITAL PROCESSES, 1980, 6 (01): : 105 - 109
- [10] CURRENT SOURCES FOR EMITTER-COUPLED LOGIC-CIRCUITS AND THEIR APPLICATION TO SUB-NANOSECOND LOGIC INTEGRATED-CIRCUITS ELECTRONICS & COMMUNICATIONS IN JAPAN, 1977, 60 (12): : 118 - 127