TRANSMISSION ELECTRON-MICROSCOPY OF LATTICE-DEFECTS IN C-60/C-70 EPITAXIAL-FILMS EVAPORATED ON MICA SUBSTRATE

An epitaxial C-60/C-70 film with the (111)(fcc)//substrate surface was deposited on a mica substrate heated to 573 K. Transmission electron microscopy revealed straight contrasts parallel to the [1 (1) over bar 0] directions (defect A) and irregularly curved contrasts (defect B) in the film. (a) The film contained a lot of doubly-positioned twins (or 180 degrees rotation twins about the [111] axis, while there was none of other [11 (1) over bar]-axes). Some of defects B were twin boundaries between the doubly-positioned twin domains. A few of defects A were {11 (2) over bar} incoherent twin boundaries. (b) Most of defects A and B were identified as stacking faults. Defects B were composed of a complex of stacking fault jogs.