AC CONDUCTIVITY IN SINGLE-CRYSTALS AND COMPACTIONS OF TCNQ COMPLEX SALTS

[1] DIELECTRIC PROPERTIES OF THIN FILMS OF ALUMINIUM OXIDE AND SILICON OXIDE [J]. THIN SOLID FILMS, 1968, 2 (03) : 185 - &

[2] CRYSTAL-STRUCTURE AND RELATED ELECTRICAL PROPERTIES OF (N,N'-DIETHYL-4,4'-BIPYRIDYLIUM)(2+)-(7,7,8,8-TETRACYANOQUINODIMETHANE)4(2-) [J]. PROCEEDINGS OF THE ROYAL SOCIETY OF LONDON SERIES A-MATHEMATICAL PHYSICAL AND ENGINEERING SCIENCES, 1975, 343 (1635): : 461 - 475

[3] ASHWELL GJ, 1979, Z NATURFORSCH A, V34, P1

[4] ASHWELL GJ, 1975, 7TH MOL CRYST S TOK

[5] ASHWELL GS, 1978, ANN NY ACAD SCI, V313, P417

[6] DREW N, 1982, MOL CRYST LIQ CRYST, V86, P1963

[7] ELECTRICAL CONDUCTIVITY OF SINGLE-CRYSTALS OF TRIETHYLAMMONIUM-(TCNQ)2 [J]. JOURNAL OF PHYSICS AND CHEMISTRY OF SOLIDS, 1972, 33 (09) : 1723 - &

[8] MOTT NF, 1971, ELECTRONIC PROCESSES

[9] LOW-FREQUENCY CONDUCTIVITY DUE TO HOPPING PROCESSES IN SILICON [J]. PHYSICAL REVIEW, 1961, 122 (06): : 1742 - &

[10] STUDY OF LOCALIZED LEVELS IN SEMI-INSULATORS BY COMBINED MEASUREMENTS OF THERMALLY ACTIVATED OHMIC AND SPACE-CHARGE-LIMITED CONDUCTION [J]. PHYSICAL REVIEW, 1969, 180 (03): : 785 - +

[1] DIELECTRIC PROPERTIES OF THIN FILMS OF ALUMINIUM OXIDE AND SILICON OXIDE [J]. THIN SOLID FILMS, 1968, 2 (03) : 185 - &

[2] CRYSTAL-STRUCTURE AND RELATED ELECTRICAL PROPERTIES OF (N,N'-DIETHYL-4,4'-BIPYRIDYLIUM)(2+)-(7,7,8,8-TETRACYANOQUINODIMETHANE)4(2-) [J]. PROCEEDINGS OF THE ROYAL SOCIETY OF LONDON SERIES A-MATHEMATICAL PHYSICAL AND ENGINEERING SCIENCES, 1975, 343 (1635): : 461 - 475

[3] ASHWELL GJ, 1979, Z NATURFORSCH A, V34, P1

[4] ASHWELL GJ, 1975, 7TH MOL CRYST S TOK

[5] ASHWELL GS, 1978, ANN NY ACAD SCI, V313, P417

[6] DREW N, 1982, MOL CRYST LIQ CRYST, V86, P1963

[7] ELECTRICAL CONDUCTIVITY OF SINGLE-CRYSTALS OF TRIETHYLAMMONIUM-(TCNQ)2 [J]. JOURNAL OF PHYSICS AND CHEMISTRY OF SOLIDS, 1972, 33 (09) : 1723 - &

[8] MOTT NF, 1971, ELECTRONIC PROCESSES

[9] LOW-FREQUENCY CONDUCTIVITY DUE TO HOPPING PROCESSES IN SILICON [J]. PHYSICAL REVIEW, 1961, 122 (06): : 1742 - &

[10] STUDY OF LOCALIZED LEVELS IN SEMI-INSULATORS BY COMBINED MEASUREMENTS OF THERMALLY ACTIVATED OHMIC AND SPACE-CHARGE-LIMITED CONDUCTION [J]. PHYSICAL REVIEW, 1969, 180 (03): : 785 - +