ANALYSIS OF GRAIN-BOUNDARY IMPURITIES AND FLUORIDE ADDITIVES IN HOT-PRESSED OXIDES BY AUGER-ELECTRON SPECTROSCOPY

被引：24

作者：

JOHNSON, WC

STEIN, DF

RICE, RW

机构：

[1] MICHIGAN TECHNOL UNIV,HOUGHTON,MI 49931

[2] USN,RES LAB,WASHINGTON,DC 20375

来源：

关键词：

D O I：

10.1111/j.1151-2916.1974.tb10918.x

中图分类号：

TQ174 [陶瓷工业]; TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

引用

页码：342 / 344

页数：3

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CHANG, CC .

[3]

JOHNSON W, UNPUBLISHED WORK

[4]

JOHNSON WC, 1972, CAN J SPECTROSC, V17, P88

[5]

JOHNSON WC, 1973, AM CERAM SOC BULL, V52, P341

[6]

KESSLER JB, P S SURFACES INTERFA

[7] IMPURITY DISTRIBUTION IN MGO [J].

LEIPOLD, MH .

[8]

Mclean D., 1957, GRAIN BOUNDARIES MET

[9]

PALMBERG PW, 1972, HDB AUGER ELECTRON S

[10]

Rice R. W., 1969, Proceedings of the British Ceramic Society, P99