MATERIAL REACTION AND SILICIDE FORMATION AT THE REFRACTORY-METAL SILICON INTERFACE

被引:40
作者
RUBLOFF, GW [1 ]
TROMP, RM [1 ]
VANLOENEN, EJ [1 ]
机构
[1] INST ATOM & MOLEC PHYS,1098 SJ AMSTERDAM,NETHERLANDS
关键词
D O I
10.1063/1.96829
中图分类号
O59 [应用物理学];
学科分类号
摘要
引用
收藏
页码:1600 / 1602
页数:3
相关论文
共 14 条
[1]   CHEMICAL AND STRUCTURAL ASPECTS OF REACTION AT THE TI SI INTERFACE [J].
BUTZ, R ;
RUBLOFF, GW ;
TAN, TY ;
HO, PS .
PHYSICAL REVIEW B, 1984, 30 (10) :5421-5429
[2]   CHEMICAL-REACTION AND SCHOTTKY-BARRIER FORMATION AT V/SI INTERFACES [J].
CLABES, JG ;
RUBLOFF, GW ;
TAN, TY .
PHYSICAL REVIEW B, 1984, 29 (04) :1540-1550
[3]  
DHEURLE FM, UNPUB
[4]   SOLID-STATE REACTIONS IN TITANIUM THIN-FILMS ON SILICON [J].
KATO, H ;
NAKAMURA, Y .
THIN SOLID FILMS, 1976, 34 (01) :135-138
[5]   CHEMICAL-REACTION AND SILICIDE FORMATION AT THE PT/SI INTERFACE [J].
MATZ, R ;
PURTELL, RJ ;
YOKOTA, Y ;
RUBLOFF, GW ;
HO, PS .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A, 1984, 2 (02) :253-258
[6]   THIN-FILM INTERACTION BETWEEN TITANIUM AND POLYCRYSTALLINE SILICON [J].
MURARKA, SP ;
FRASER, DB .
JOURNAL OF APPLIED PHYSICS, 1980, 51 (01) :342-349
[7]   MICROSCOPIC PROPERTIES AND BEHAVIOR OF METAL-SEMICONDUCTOR INTERFACES [J].
RUBLOFF, GW .
FESTKORPERPROBLEME-ADVANCES IN SOLID STATE PHYICS, 1983, 23 :179-206
[8]   MICROSCOPIC PROPERTIES AND BEHAVIOR OF SILICIDE INTERFACES [J].
RUBLOFF, GW .
SURFACE SCIENCE, 1983, 132 (1-3) :268-314
[9]   ION-BEAM CRYSTALLOGRAPHY OF METAL SILICON INTERFACES - PD-SI(111) [J].
TROMP, R ;
VANLOENEN, EJ ;
IWAMI, M ;
SMEENK, R ;
SARIS, FW .
THIN SOLID FILMS, 1982, 93 (1-2) :151-159
[10]   ION-BEAM ANALYSIS OF THE REACTION OF PD WITH SI(100) AND SI(111) AT ROOM-TEMPERATURE [J].
TROMP, RM ;
VANLOENEN, EJ ;
IWAMI, M ;
SMEENK, RG ;
SARIS, FW ;
NAVA, F ;
OTTAVIANI, G .
SURFACE SCIENCE, 1983, 124 (01) :1-25