THE FORMATION OF HYDROGEN PASSIVATED SILICON SINGLE-CRYSTAL SURFACES USING ULTRAVIOLET CLEANING AND HF ETCHING

被引:505
作者
TAKAHAGI, T [1 ]
NAGAI, I [1 ]
ISHITANI, A [1 ]
KURODA, H [1 ]
NAGASAWA, Y [1 ]
机构
[1] TORAY RES CTR INC,OTSU,SHIGA,JAPAN
关键词
D O I
10.1063/1.341489
中图分类号
O59 [应用物理学];
学科分类号
摘要
引用
收藏
页码:3516 / 3521
页数:6
相关论文
共 33 条
[1]   PATTERNED SILICON MOLECULAR-BEAM EPITAXY WITH SUB-MICRON LATERAL RESOLUTION [J].
BEAN, JC ;
ROZGONYI, GA .
APPLIED PHYSICS LETTERS, 1982, 41 (08) :752-755
[2]   DEPENDENCE OF RESIDUAL DAMAGE ON TEMPERATURE DURING AR+ SPUTTER CLEANING OF SILICON [J].
BEAN, JC ;
BECKER, GE ;
PETROFF, PM ;
SEIDEL, TE .
JOURNAL OF APPLIED PHYSICS, 1977, 48 (03) :907-913
[3]   MEAN FREE-PATH OF PHOTO-ELECTRONS IN SILICON AND SILICON-OXIDES [J].
BECHSTEDT, F ;
HUBNER, K .
PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1981, 67 (02) :517-526
[4]   ACCEPTOR DOPANTS IN SILICON MOLECULAR-BEAM EPITAXY [J].
BECKER, GE ;
BEAN, JC .
JOURNAL OF APPLIED PHYSICS, 1977, 48 (08) :3395-3399
[5]  
BRODSKY MH, 1977, PHYS REV B, V16, P3556, DOI 10.1103/PhysRevB.16.3556
[6]   SURFACE INFRARED STUDY OF SI(100)-(2X1)H [J].
CHABAL, YJ ;
RAGHAVACHARI, K .
PHYSICAL REVIEW LETTERS, 1984, 53 (03) :282-285
[7]   HYDRIDE FORMATION ON THE SI(100)-H2O SURFACE [J].
CHABAL, YJ .
PHYSICAL REVIEW B, 1984, 29 (06) :3677-3680
[9]   SILICON SURFACE CLEANING BY LOW-DOSE ARGON-ION BOMBARDMENT FOR LOW-TEMPERATURE (750-DEGREES-C) EPITAXIAL SILICON DEPOSITION .1. PROCESS CONSIDERATIONS [J].
COMFORT, JH ;
GARVERICK, LM ;
REIF, R .
JOURNAL OF APPLIED PHYSICS, 1987, 62 (08) :3388-3397
[10]   SILICON SURFACE CLEANING BY LOW-DOSE ARGON-ION BOMBARDMENT FOR LOW-TEMPERATURE (750-DEGREES-C) EPITAXIAL DEPOSITION .2. EPITAXIAL QUALITY [J].
GARVERICK, LM ;
COMFORT, JH ;
YEW, TR ;
REIF, R ;
BAIOCCHI, FA ;
LUFTMAN, HS .
JOURNAL OF APPLIED PHYSICS, 1987, 62 (08) :3398-3404