O-18 TRACER STUDY OF SI OXIDATION IN DRY O-2 USING SIMS

被引：38

|

作者：

HAN, CJ

HELMS, CR

机构：

来源：

JOURNAL OF THE ELECTROCHEMICAL SOCIETY | 1988年 / 135卷 / 07期

关键词：

D O I：

10.1149/1.2096140

中图分类号：

O646 [电化学、电解、磁化学];

学科分类号：

081704 ;

摘要：

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页码：1824 / 1832

页数：9

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