CHARGE COLLECTION IN SILICON STRIP DETECTORS

被引：175

作者：

BELAU, E

KLANNER, R

LUTZ, G

NEUGEBAUER, E

SEEBRUNNER, HJ

WYLIE, A

BOHRINGER, T

HUBBELING, L

WEILHAMMER, P

KEMMER, J

KOTZ, U

RIEBESELL, M

机构：

[1] CERN,CH-1211 GENEVA 23,SWITZERLAND

[2] TECH UNIV MUNICH,D-8000 MUNICH 2,FED REP GER

[3] DESY,D-2000 HAMBURG 52,FED REP GER

[4] UNIV HAMBURG,D-2000 HAMBURG 13,FED REP GER

来源：

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH | 1983年 / 214卷 / 2-3期

关键词：

D O I：

10.1016/0167-5087(83)90591-4

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

页码：253 / 260

页数：8

共 9 条

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[7]

SZE SM, 1981, PHYSICS SEMICONDUCTO

[8]

1978, CERNSPSC7814 PROP

[9]

1982, LANDOLTBORNSTEIN A, V17, P68

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