1/F NOISE IN N-CHANNEL SILICON-GATE MOS-TRANSISTORS

被引:67
|
作者
MIKOSHIBA, H
机构
关键词
D O I
10.1109/T-ED.1982.20815
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
引用
收藏
页码:965 / 970
页数:6
相关论文
共 50 条
  • [31] THRESHOLD VOLTAGE VARIATIONS IN N-CHANNEL MOS-TRANSISTORS AND MOSFET-BASED SENSORS DUE TO OPTICAL RADIATION
    WLODARSKI, W
    BERGVELD, P
    VOORTHUYZEN, JA
    SENSORS AND ACTUATORS, 1986, 9 (04): : 313 - 321
  • [32] MODELING OF GATE OXIDE SHORTS IN MOS-TRANSISTORS
    SYRZYCKI, M
    IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS, 1989, 8 (03) : 193 - 202
  • [33] SHORT CHANNEL EFFECTS IN MOS-TRANSISTORS
    BJORKQVIST, K
    ARNBORG, T
    PHYSICA SCRIPTA, 1981, 24 (02): : 418 - 421
  • [34] Impact of Gate Oxide Thickness on Flicker Noise (1/f) in PDSOI n-channel FETs
    Pathak, Shruti
    Gupta, Sumreti
    Rathi, Aarti
    Srinivasan, P.
    Dixit, Abhisek
    SOLID-STATE ELECTRONICS, 2024, 217
  • [35] THRESHOLD VOLTAGES OF SHORT-CHANNEL DUAL-GATE MOS-TRANSISTORS
    BARSAN, RM
    REVUE ROUMAINE DE PHYSIQUE, 1982, 27 (02): : 191 - 209
  • [36] THRESHOLD VOLTAGE AND GAIN TERM BETA OF ION-IMPLANTED ENHANCEMENT-MODE N-CHANNEL MOS-TRANSISTORS
    KAMOSHID.M
    APPLIED PHYSICS LETTERS, 1973, 22 (08) : 404 - 405
  • [37] CURRENT-KINK NOISE OF N-CHANNEL ENHANCEMENT ESFI-MOS SOS TRANSISTORS
    FICHTNER, W
    HOCHMAIR, E
    ELECTRONICS LETTERS, 1977, 13 (22) : 675 - 676
  • [38] IMPACT OF SCALING DOWN ON LOW-FREQUENCY NOISE IN SILICON MOS-TRANSISTORS
    GHIBAUDO, G
    ROUXDITBUISSON, O
    BRINI, J
    PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1992, 132 (02): : 501 - 507
  • [39] LOW-FREQUENCY NOISE IN MOS-TRANSISTORS
    GENTIL, P
    ONDE ELECTRIQUE, 1978, 58 (8-9): : 565 - 575
  • [40] The study of damage generation in n-channel MOS transistors operating in the substrate enhanced gate current regime
    Mohapatra, NR
    Mahapatra, S
    Rao, VR
    PROCEEDINGS OF THE 9TH INTERNATIONAL SYMPOSIUM ON THE PHYSICAL & FAILURE ANALYSIS OF INTEGRATED CIRCUITS, 2002, : 27 - 30