FINITE-SIZE EFFECTS IN THE LOW-TEMPERATURE RESISTIVITY OF CUCR FILMS

被引：51

作者：

DITUSA, JF ^{[1
]}

LIN, K ^{[1
]}

PARK, M ^{[1
]}

ISAACSON, MS ^{[1
]}

PARPIA, JM ^{[1
]}

机构：

[1] CORNELL UNIV,SCH APPL & ENGN PHYS,ITHACA,NY 14853

来源：

PHYSICAL REVIEW LETTERS | 1992年 / 68卷 / 05期

关键词：

D O I：

10.1103/PhysRevLett.68.678

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

The effect of finite sample size on the Kondo resistance anomaly has been explored in the CuCr system. The resistivity of thin CuCr films was studied as a function of width from 0.5 to 20 K. The magnitude of the Kondo anomaly is significantly depressed as the film width is reduced below 10-mu-m. This length scale is consistent with the radius of the electron-spin correlation cloud, suggesting a crossover from two- to one-dimensional behavior. A concurrent decrease in the temperature of the resistivity maximum suggests a diminished interimpurity interaction strength.

引用

页码：678 / 681

页数：4

共 17 条

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Abrikosov A. A., 1988, FUNDAMENTALS THEORY

[2] CRITICAL SIZE OF SMALL PARTICLES FOR THE DEVELOPMENT OF RESONANCES [J].