INTERFACE ROUGHNESS SCATTERING IN NORMAL AND INVERTED IN0.53GA0.47AS-IN0.52AL0.48AS MODULATION-DOPED HETEROSTRUCTURES

被引：0
作者：
HONG, WP
SINGH, J
BHATTACHARYA, PK
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来源：
IEEE ELECTRON DEVICE LETTERS | 1986年 / 7卷 / 08期
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TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
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页码：480 / 482
页数：3
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