RTK-2 - A DOUBLE-CRYSTAL X-RAY TOPOGRAPHIC CAMERA APPLYING NEW PRINCIPLES

被引：29
作者：
JENICHEN, B
KOHLER, R
MOHLING, W
机构：
[1] Akad der Wissenschaften der DDR, Germany
来源：
JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS | 1988年 / 21卷 / 11期
关键词：
D O I：
10.1088/0022-3735/21/11/012
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
12
引用
收藏
页码：1062 / 1066
页数：5
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