MODELING HOMOGENEOUS AND HETEROGENEOUS METAL-SEMICONDUCTOR INTERFACE REACTIONS WITH PHOTOEMISSION AND ANGLE-RESOLVED AUGER-SPECTROSCOPY

被引:10
作者
DELGIUDICE, M
GRIONI, M
JOYCE, JJ
RUCKMAN, MW
CHAMBERS, SA
WEAVER, JH
机构
关键词
D O I
10.1016/0039-6028(86)90861-7
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
引用
收藏
页码:309 / 322
页数:14
相关论文
共 17 条
[1]  
BRILLSON LJ, 1982, SURFACE SCI REPT, V2, P124
[2]  
BUTERA RA, 1986, PHYS REV B, V33
[3]   STRUCTURAL CHARACTERIZATION OF METAL-METAL INTERFACES BY INTERMEDIATE-ENERGY AUGER-ELECTRON DIFFRACTION [J].
CHAMBERS, SA ;
ANDERSON, SB ;
WEAVER, JH .
PHYSICAL REVIEW B, 1985, 32 (08) :4872-4875
[4]   CHARACTERIZATION OF INTERMIXING AT METAL-SEMICONDUCTOR INTERFACES BY ANGLE-RESOLVED AUGER-ELECTRON EMISSION - CU/SI(111)-7X7 [J].
CHAMBERS, SA ;
HOWELL, GA ;
GREENLEE, TR ;
WEAVER, JH .
PHYSICAL REVIEW B, 1985, 31 (10) :6402-6410
[5]   CLUSTER FORMATION AND ATOMIC INTERMIXING AT THE REACTIVE V/GE(111) INTERFACE [J].
DELGIUDICE, M ;
JOYCE, JJ ;
RUCKMAN, MW ;
WEAVER, JH .
PHYSICAL REVIEW B, 1985, 32 (08) :5149-5155
[6]  
DELGIUDICE M, UNPUB PHYS REV LETT
[7]   MODELING OF INTERFACE REACTION-PRODUCTS WITH HIGH-RESOLUTION CORE-LEVEL PHOTOEMISSION [J].
GRIONI, M ;
DELGIUDICE, M ;
JOYCE, JJ ;
WEAVER, JH .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1985, 3 (03) :907-910
[8]   MODELING A HETEROGENEOUS METAL-SEMICONDUCTOR INTERFACE - CE ON SI(111) [J].
GRIONI, M ;
JOYCE, J ;
DELGIUDICE, M ;
ONEILL, DG ;
WEAVER, JH .
PHYSICAL REVIEW B, 1984, 30 (12) :7370-7373
[9]  
Joyce J. J., UNPUB
[10]  
KERR R, 1975, CURRENT TOPICS MATER, V3