A THEORY FOR THE DESIGN OF SOFT-ERROR-TOLERANT VLSI CIRCUITS

被引：2
|
作者：
SAVARIA, Y
HAYES, JF
RUMIN, NC
AGARWAL, VK
机构：
[1] MCGILL UNIV,DEPT ELECT ENGN,MONTREAL H3A 2T5,QUEBEC,CANADA
[2] CONCORDIA UNIV,DEPT ELECT ENGN,MONTREAL H3G 1M8,QUEBEC,CANADA
来源：
IEEE JOURNAL ON SELECTED AREAS IN COMMUNICATIONS | 1986年 / 4卷 / 01期
关键词：
D O I：
10.1109/JSAC.1986.1146297
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
收藏
页码：15 / 23
页数：9
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