UNBIASED ESTIMATION OF PARTICLE DENSITY IN THE TANDEM SCANNING REFLECTED LIGHT-MICROSCOPE

被引：118

作者：

HOWARD, V

REID, S

BADDELEY, A

BOYDE, A

机构：

[1] UNIV LONDON UNIV COLL,DEPT ANAT & EMBRYOL,LONDON WC1E 6BT,ENGLAND

[2] UNIV BATH,SCH MATH,BATH BA2 7AY,AVON,ENGLAND

来源：

JOURNAL OF MICROSCOPY-OXFORD | 1985年 / 138卷 / MAY期

关键词：

D O I：

10.1111/j.1365-2818.1985.tb02613.x

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

引用

页码：203 / 212

页数：10

共 14 条

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[2]

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[3]

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[6] ESTIMATION OF SECTION THICKNESS UNBIASED BY CUTTING-DEFORMATION [J].

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ANDERSEN, BS ;

FLOE, H .

JOURNAL OF MICROSCOPY-OXFORD, 1983, 131 (JUL) :RP3-RP4

[7]

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[8]

HOBDELL MH, 1970, THESIS U LONDON

[9]

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[10] SAMPLING, BY QUADRATS, OF PLANAR AGGREGATES [J].

MILES, RE .

JOURNAL OF MICROSCOPY-OXFORD, 1978, 113 (AUG) :257-267

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