PHASE SENSITIVE SCANNING OPTICAL MICROSCOPE

[1] PHASE RECOVERY FROM OPTICAL-PHASE CONTRAST MICROSCOPY [J]. PROCEEDINGS OF THE IEEE, 1983, 71 (02) : 270 - 271

[2] ACOUSTIC-SURFACE-WAVE AMPLITUDE AND PHASE MEASUREMENTS USING LASER PROBES [J]. PROCEEDINGS OF THE INSTITUTION OF ELECTRICAL ENGINEERS-LONDON, 1972, 119 (02): : 117 - +

[3] GUILLAUME ME, 1984, MAY FIB OPT LAS SENS, V2

[4] Jupnik H, 1951, PHASE MICROSCOPY PRI

[5] KINO G. S., 1980, SCANNED IMAGE MICROS, P1

[6] KRUG W, 1951, CONTRIBUTIONS INTERF

[7] QUANTITATIVE SURFACE-TOPOGRAPHY DETERMINATION BY NOMARSKI REFLECTION MICROSCOPY .1. THEORY [J]. JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1979, 69 (02) : 357 - 366

[8] Naguib M., UNPUB

[9] IMAGE-FORMATION IN SCANNING MICROSCOPE [J]. OPTICA ACTA, 1977, 24 (10): : 1051 - 1073

[10] OPTICAL HETERODYNE PROFILOMETRY [J]. APPLIED OPTICS, 1981, 20 (04): : 610 - 618

[1] PHASE RECOVERY FROM OPTICAL-PHASE CONTRAST MICROSCOPY [J]. PROCEEDINGS OF THE IEEE, 1983, 71 (02) : 270 - 271

[2] ACOUSTIC-SURFACE-WAVE AMPLITUDE AND PHASE MEASUREMENTS USING LASER PROBES [J]. PROCEEDINGS OF THE INSTITUTION OF ELECTRICAL ENGINEERS-LONDON, 1972, 119 (02): : 117 - +

[3] GUILLAUME ME, 1984, MAY FIB OPT LAS SENS, V2

[4] Jupnik H, 1951, PHASE MICROSCOPY PRI

[5] KINO G. S., 1980, SCANNED IMAGE MICROS, P1

[6] KRUG W, 1951, CONTRIBUTIONS INTERF

[7] QUANTITATIVE SURFACE-TOPOGRAPHY DETERMINATION BY NOMARSKI REFLECTION MICROSCOPY .1. THEORY [J]. JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1979, 69 (02) : 357 - 366

[8] Naguib M., UNPUB

[9] IMAGE-FORMATION IN SCANNING MICROSCOPE [J]. OPTICA ACTA, 1977, 24 (10): : 1051 - 1073

[10] OPTICAL HETERODYNE PROFILOMETRY [J]. APPLIED OPTICS, 1981, 20 (04): : 610 - 618