STUDY OF SILICATE ADSORPTION ON GIBBSITE (AL(OH)3) BY X-RAY PHOTOELECTRON-SPECTROSCOPY (XPS)

被引:15
作者
ALVAREZ, R
FADLEY, CS
SILVA, JA
UEHARA, G
机构
[1] UNIV HAWAII,DEPT AGRON & SOIL SCI,HONOLULU,HI 96822
[2] UNIV HAWAII,DEPT CHEM,HONOLULU,HI 96822
关键词
D O I
10.2136/sssaj1976.03615995004000040043x
中图分类号
S15 [土壤学];
学科分类号
0903 ; 090301 ;
摘要
引用
收藏
页码:615 / 617
页数:3
相关论文
共 12 条
[1]   CONCENTRATION PROFILES FOR IRREGULAR SURFACES FROM X-RAY PHOTOELECTRON ANGULAR-DISTRIBUTIONS [J].
BAIRD, RJ ;
FADLEY, CS ;
KAWAMOTO, SK ;
MEHTA, M ;
ALVAREZ, R ;
SILVA, JA .
ANALYTICAL CHEMISTRY, 1976, 48 (06) :843-846
[2]  
CARTER WJ, 1974, J ELECTRON SPECTROS, V5, P829
[3]  
CLARK DT, 1973, ELECTRON EMISSION SP, P273
[4]   SURFACE ANALYSIS AND ANGULAR-DISTRIBUTIONS IN X-RAY PHOTOELECTRON-SPECTROSCOPY [J].
FADLEY, CS ;
BAIRD, RJ ;
SIEKHAUS, W ;
NOVAKOV, T ;
BERGSTROM, SA .
JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, 1974, 4 (02) :93-137
[5]  
GARRELS R.M., 1965, SOLUTIONS MINERALS E
[6]  
HAGSTROM SBM, 1972, XRAY SPECTROSCOPY, P379
[7]  
PLUCKNETT DL, 1972, 1 U QUEENSL PAP, V6, P203
[8]   ATTENUATION LENGTHS OF LOW-ENERGY ELECTRONS IN SOLIDS [J].
POWELL, CJ .
SURFACE SCIENCE, 1974, 44 (01) :29-46
[9]  
SCOFIELD JH, 1973, UCRL51326 REP
[10]  
SIEGBAHN K, 1968, AFMLTR68189 NAT TECH