THEORETICAL AND EXPERIMENTAL ASPECTS OF SECONDARY ION MASS-SPECTROMETRY

[41] SECONDARY ION MASS ANALYSIS - TECHNIQUE FOR 3-DIMENSIONAL CHARACTERIZATION [J]. ANALYTICAL CHEMISTRY, 1972, 44 (13) : A67 - &

[42] ANALYSIS OF THIN FILMS BY ION MICROPROBE MASS SPECTROMETRY [J]. ANALYTICAL CHEMISTRY, 1970, 42 (09) : 1060 - &

[43] GALAN LD, TABLE PARTITION FUNC

[44] GAUKLER KH, 1972, OCT M QUANT AN EL MI

[45] HENNEQUIN JF, 1968, THESIS ORSAY

[46] HERNANDEZ R, 1973, MEM ETUD SCI REV MET, V70, P47

[47] Hernandez R., 1972, RECH AEROSPATIALE, V6, P313

[48] HERNANDEZ R, 1970, METHODES PHYSIQUES A, V6, P411

[49] ION SOURCE FOR MASS SPECTROGRAPHY [J]. PHYSICAL REVIEW, 1949, 76 (06): : 855 - 856

[50] HERZOG RFK, 1972, P INT C ION SPUTTERI, P173

[41] SECONDARY ION MASS ANALYSIS - TECHNIQUE FOR 3-DIMENSIONAL CHARACTERIZATION [J]. ANALYTICAL CHEMISTRY, 1972, 44 (13) : A67 - &

[42] ANALYSIS OF THIN FILMS BY ION MICROPROBE MASS SPECTROMETRY [J]. ANALYTICAL CHEMISTRY, 1970, 42 (09) : 1060 - &

[43] GALAN LD, TABLE PARTITION FUNC

[44] GAUKLER KH, 1972, OCT M QUANT AN EL MI

[45] HENNEQUIN JF, 1968, THESIS ORSAY

[46] HERNANDEZ R, 1973, MEM ETUD SCI REV MET, V70, P47

[47] Hernandez R., 1972, RECH AEROSPATIALE, V6, P313

[48] HERNANDEZ R, 1970, METHODES PHYSIQUES A, V6, P411

[49] ION SOURCE FOR MASS SPECTROGRAPHY [J]. PHYSICAL REVIEW, 1949, 76 (06): : 855 - 856

[50] HERZOG RFK, 1972, P INT C ION SPUTTERI, P173