THEORETICAL AND EXPERIMENTAL ASPECTS OF SECONDARY ION MASS-SPECTROMETRY

[1] ALKEMADE CT, 1971, EXCITATION DE EXCITA, V9, P1

[2] Andersen C.A., 1969, International Journal of Mass Spectrometry and Ion Physics, V2, P61

[3] ION MICROPROBE MASS ANALYZER [J]. SCIENCE, 1972, 175 (4024) : 853 - +

[4] THERMODYNAMIC APPROACH TO QUANTITATIVE INTERPRETATION OF SPUTTERED ION MASS-SPECTRA [J]. ANALYTICAL CHEMISTRY, 1973, 45 (08) : 1421 - 1438

[5] ANDERSEN N, 7322 NC OORST I KOB

[6] Anderson C.A., 1970, International Journal of Mass Spectrometry and Ion Physics, V3, P413, DOI [10.1016/0020-7381(70)80001-8, DOI 10.1016/0020-7381(70)80001-8]

[7] [Anonymous], APPLIED PHYSICS

[8] PARTIAL DISINTEGRATION AND CHANGE OF CONCENTRATION PROFILES AT ION BOMBARDED NA SILICATE GLASS SURFACES [J]. RADIATION EFFECTS AND DEFECTS IN SOLIDS, 1974, 22 (02): : 73 - 78

[9] BEHRISCH R, 1964, ERGEBN EXACT NATURW, V35, P294

[10] BENNINGH.A, 1965, ANN PHYS-BERLIN, V15, P113

[1] ALKEMADE CT, 1971, EXCITATION DE EXCITA, V9, P1

[2] Andersen C.A., 1969, International Journal of Mass Spectrometry and Ion Physics, V2, P61

[3] ION MICROPROBE MASS ANALYZER [J]. SCIENCE, 1972, 175 (4024) : 853 - +

[4] THERMODYNAMIC APPROACH TO QUANTITATIVE INTERPRETATION OF SPUTTERED ION MASS-SPECTRA [J]. ANALYTICAL CHEMISTRY, 1973, 45 (08) : 1421 - 1438

[5] ANDERSEN N, 7322 NC OORST I KOB

[6] Anderson C.A., 1970, International Journal of Mass Spectrometry and Ion Physics, V3, P413, DOI [10.1016/0020-7381(70)80001-8, DOI 10.1016/0020-7381(70)80001-8]

[7] [Anonymous], APPLIED PHYSICS

[8] PARTIAL DISINTEGRATION AND CHANGE OF CONCENTRATION PROFILES AT ION BOMBARDED NA SILICATE GLASS SURFACES [J]. RADIATION EFFECTS AND DEFECTS IN SOLIDS, 1974, 22 (02): : 73 - 78

[9] BEHRISCH R, 1964, ERGEBN EXACT NATURW, V35, P294

[10] BENNINGH.A, 1965, ANN PHYS-BERLIN, V15, P113