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- [3] SECONDARY ION MASS-SPECTROMETRY OF GLASSES - ASPECTS OF QUANTIFICATION SCANNING ELECTRON MICROSCOPY, 1985, : 927 - 934
- [5] SECONDARY ION MASS-SPECTROMETRY CESKOSLOVENSKY CASOPIS PRO FYSIKU SEKCE A, 1974, 24 (04): : C396 - 397
- [6] SECONDARY ION MASS-SPECTROMETRY JOURNAL DE MICROSCOPIE ET DE SPECTROSCOPIE ELECTRONIQUES, 1982, 7 (03): : A50 - A50
- [10] ON THE QUANTITATIVE ASPECTS OF OXYGEN ENHANCEMENT IN SECONDARY ION MASS-SPECTROMETRY JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1987, 5 (04): : 1220 - 1220