STRESS-ANALYSIS AND FAILURE POSSIBILITY ASSESSMENT OF MULTILAYER PHYSICALLY VAPOR-DEPOSITED COATINGS

被引:34
作者
LYUBIMOV, VV [1 ]
VOEVODIN, AA [1 ]
SPASSKY, SE [1 ]
YEROKHIN, AL [1 ]
机构
[1] TULA POLYTECH INST,ELECTROPHYS & ELECTROCHEM TREATMENT LAB,TULA 300600,USSR
关键词
D O I
10.1016/0040-6090(92)90111-N
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
A mathematical model for stress analysis and failure possibility assessment of multilayer coatings produced by ion-assisted physical vapour deposition (PVD) is proposed. Stresses in coating layers are divided into thermal, intrinsic and operational stresses. Calculations of thermal stresses and intrinsic stresses caused by interstitials are performed for TiN and titanium layers on stainless steel substrates. Coating failures as a result of a single layer failure, interface crack propagation and peeling above an area with imperfect adhesion are discussed. The model enables the determination of optimal thicknesses and deposition conditions of layers. X-ray diffraction stress measurements make it possible to estimate the model errors, which are found to be 15%-20%. As an example, calculations for PVD coatings with TiN and titanium layers are carried out. It is concluded that it is useful to interpose the ceramic and metal layers to reduce interface shear forces.
引用
收藏
页码:117 / 125
页数:9
相关论文
共 58 条
[1]   EVALUATION OF ADHESION STRENGTH OF THIN HARD COATINGS [J].
ARAI, T ;
FUJITA, H ;
WATANABE, M .
THIN SOLID FILMS, 1987, 154 (1-2) :387-401
[2]  
BARVINOK VA, 1982, IZV AKAD NAUK SSSR E, V6, P128
[3]   LATTICE VACANCIES IN TIN AND HFN FILMS - A STUDY BY POSITRON-ANNIHILATION [J].
BRUNNER, J ;
PERRY, AJ .
THIN SOLID FILMS, 1987, 153 :103-113
[4]  
CHEREPANOV GP, 1983, MECHANIKA RAZRUSHENI, P50
[5]  
Cherepanov GP, 1979, MECH BRITTLE FRACTUR, P950
[6]   THE STRESS IN ION-PLATED HFN AND TIN COATINGS [J].
CHOLLET, L ;
PERRY, AJ .
THIN SOLID FILMS, 1985, 123 (03) :223-234
[7]  
Cullity B., 1978, MEASUREMENT RESIDUAL, V2nd, P447
[8]   NOTE ON THE ORIGIN OF INTRINSIC STRESSES IN FILMS DEPOSITED VIA EVAPORATION AND SPUTTERING [J].
DHEURLE, FM ;
HARPER, JME .
THIN SOLID FILMS, 1989, 171 (01) :81-92
[9]   COLUMNAR MICROSTRUCTURE IN VAPOR-DEPOSITED THIN-FILMS [J].
DIRKS, AG ;
LEAMY, HJ .
THIN SOLID FILMS, 1977, 47 (03) :219-233
[10]   INFLUENCE OF MULTIAXIAL STRESS STATES, STRESS GRADIENTS AND ELASTIC-ANISOTROPY ON THE EVALUATION OF (RESIDUAL) STRESSES BY X-RAYS [J].
DOLLE, H .
JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1979, 12 (DEC) :489-501