FORMAL THEORY OF MEASUREMENT IN SURFACE-TOPOGRAPHY REPRESENTATION

被引:0
作者
LUO, NL
SULLIVAN, PJ
机构
关键词
D O I
10.1016/0890-6955(92)90076-S
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Surface topography measurement has always involved the representation of surface topography by statistical parameters and functions based on a single profile or parallel multiple profiles in the Euclidean or fractal dimensions. In this paper, we intend to formalise the process of surface topography measurement using the representational theory of measurement in the hope of bridging the large epistemological gap between measurement theorists and surface metrologists. A brief description of the formal measurement theory is given. Conceptualisation of the nature of surface topography measurement is presented in terms of multidimensional implementation of the theory. It is shown as a result of this conceptual formalism that current surface topography representation techniques are fundamentally inadequate to qualify as measurement processes as dictated by this theory. The representational measurement theory may help formulate new methodologies for surface topography representation.
引用
收藏
页码:179 / 182
页数:4
相关论文
共 11 条
[1]  
Sydenham, Handbook of Measurement Science, Vol. 1, Fundamental Principles, (1982)
[2]  
Sydenham, Measuring Instruments: tools of knowledge and control, (1979)
[3]  
Finkelstein, Theory and Philosophy of Measurement, Handbook of Measurement Science, Vol 1 Fundamental Principles, (1982)
[4]  
Finkelstein, Fundamental Concepts of Measurements: Definition and Scales, Measurement and Control, 8, pp. 105-111, (1975)
[5]  
Krantz, Luce, Suppes, Tversky, Foundations of Measurement, Vol. 1: Additive and Polynomial Representations, (1971)
[6]  
Michell, An Introduction to the logic of Psychological Measurement, (1990)
[7]  
Narens, Abstract Measurement Theory, (1985)
[8]  
Kyburg, Theory and Measurement, (1984)
[9]  
Pfanzagl, Measurement Theory, (1968)
[10]  
Berka, Measurement, its Concepts, Theories, and Problems, (1983)