INTERFACE CIRCUIT BETWEEN A CAPACITANCE METER (PAR-410) AND A MICROCOMPUTER (APPLE-II)

被引:0
作者
BOHLIN, K
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D O I
10.1063/1.1138385
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
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页码:2147 / 2150
页数:4
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JOURNAL OF APPLIED PHYSICS, 1974, 45 (07) :3023-3032
[3]  
NICOLLIAN EH, 1982, MOS METAL OXIDE SEMI, P411
[4]  
NICOLLIAN EH, 1982, MOS METAL OXIDE SEMI, P591
[5]  
SZE SM, 1981, PHYSICS SEMICONDUCTO, pCH7