CURRENT RESEARCH USING THE ANL HIGH-VOLTAGE ELECTRON-MICROSCOPE TANDEM ACCELERATOR FACILITY

被引：3
|
作者：
TAYLOR, A
RYAN, EA
机构：
来源：
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS | 1985年 / 10-1卷 / MAY期
关键词：
D O I：
10.1016/0168-583X(85)90084-9
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
引用
收藏
页码：687 / 692
页数：6
相关论文
共 50 条
  • [1] ADAPTATION OF AN ION ACCELERATOR TO A HIGH-VOLTAGE ELECTRON-MICROSCOPE
    JESSER, WA
    HORTON, JA
    SCRIBNER, LL
    RADIATION EFFECTS AND DEFECTS IN SOLIDS, 1976, 29 (02): : 79 - 82
  • [2] EXPERIENCE OF USING THE HIGH-VOLTAGE ELECTRON-MICROSCOPE
    MASLENKOV, SB
    KANTOR, MM
    VESTNIK AKADEMII NAUK SSSR, 1989, (11) : 39 - 46
  • [3] HIGH-VOLTAGE ELECTRON-MICROSCOPE AUTORADIOGRAPHY
    HIROSAWA, K
    HAMA, K
    CELL STRUCTURE AND FUNCTION, 1980, 5 (04) : 389 - 389
  • [4] THE HIGH-VOLTAGE ELECTRON-MICROSCOPE IN VIROLOGY
    MAZZONE, HM
    WRAY, G
    ENGLER, WF
    ADVANCES IN VIRUS RESEARCH, 1985, 30 : 43 - 82
  • [5] SPUTTERING IN HIGH-VOLTAGE ELECTRON-MICROSCOPE
    CHERNS, D
    MINTER, FJ
    NELSON, RS
    NUCLEAR INSTRUMENTS & METHODS, 1976, 132 (JAN-F): : 369 - 376
  • [6] SPUTTERING IN THE HIGH-VOLTAGE ELECTRON-MICROSCOPE
    CHERNS, D
    SURFACE SCIENCE, 1979, 90 (02) : 339 - 356
  • [7] MICROPROBE IN A HIGH-VOLTAGE ELECTRON-MICROSCOPE
    CHAPMAN, PF
    STOBBS, WM
    JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1973, 6 (04): : 373 - 376
  • [8] LIGHT-ION ACCELERATOR HIGH-VOLTAGE ELECTRON-MICROSCOPE FACILITY FOR CTR RADIATION-DAMAGE STUDIES
    JESSER, WA
    BULLETIN OF THE AMERICAN PHYSICAL SOCIETY, 1978, 23 (08): : 1038 - 1038
  • [9] COMPUTER-SIMULATION OF ELECTRON MULTIPLICATION IN ACCELERATOR TUBES OF HIGH-VOLTAGE ELECTRON-MICROSCOPE
    TAKAOKA, A
    FUNAKI, S
    MOMOTA, K
    URA, K
    JOURNAL OF ELECTRON MICROSCOPY, 1979, 28 (03): : 223 - 223
  • [10] LIGHT-ION ACCELERATOR HIGH-VOLTAGE ELECTRON-MICROSCOPE FACILITY FOR CTR RADIATION-DAMAGE STUDIES
    JESSER, WA
    IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1979, 26 (01) : 1252 - 1256
12345