EXTENDED FINE AUGER STRUCTURE SPECTROSCOPY OF AG AND CU

被引：26
作者：
DECRESCENZI, M [1 ]
HITCHCOCK, AP [1 ]
TYLISZCZAK, T [1 ]
机构：
[1] MCMASTER UNIV,INST MAT RES,HAMILTON L8S 4M1,ONTARIO,CANADA
来源：
PHYSICAL REVIEW B | 1989年 / 39卷 / 14期
关键词：
D O I：
10.1103/PhysRevB.39.9839
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
引用
收藏
页码：9839 / 9851
页数：13
相关论文
共 57 条
[1]   L2,3 EDGE OF SILICON - THEORY AND EXPERIMENT [J].
AEBI, P ;
KELLER, J ;
ERBUDAK, M ;
VANINI, F .
PHYSICAL REVIEW B, 1988, 38 (08) :5392-5396
[2]   ELECTRONIC AND X-RAY-ABSORPTION STRUCTURE IN COMPRESSED COPPER [J].
ALBERS, RC ;
MCMAHAN, AK ;
MULLER, JE .
PHYSICAL REVIEW B, 1985, 31 (06) :3435-3450
[3]   AUTOIONIZATION IN BULK, MULTILAYER, AND MONOLAYER CR [J].
BADER, SD ;
ZAJAC, G ;
ARKO, AJ ;
BRODSKY, MB ;
MORRISON, TI ;
ZALUZEC, N ;
ZAK, J ;
BENBOW, RL ;
HURYCH, Z .
PHYSICAL REVIEW B, 1986, 33 (06) :3636-3643
[4]  
BAUDOING R, 1984, SCAN ELECTRON MICROS, P87
[5]   DIFFRACTION PEAKS IN SECONDARY-ELECTRON ENERGY-SPECTRA [J].
BECKER, GE ;
HAGSTRUM, HD .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1974, 11 (01) :284-287
[6]   CORRELATION AND AUTOIONIZATION EFFECTS IN SILICIDE AUGER-SPECTRA [J].
BISI, O ;
DELPENNINO, U ;
GRANDI, L ;
VALERI, S ;
YIMING, X .
THIN SOLID FILMS, 1986, 140 (01) :89-93
[7]   AUTOIONIZATION EMISSION FOR X-RAY-EXCITED AUGER-SPECTRA IN THE COMPTON-SCATTERING PROCESS [J].
BRENER, R ;
FELSTEINER, J ;
TYK, R ;
ZAK, J .
PHYSICAL REVIEW B, 1988, 37 (03) :1387-1390
[8]   EXTENDED FINE-STRUCTURES IN THE AUGER-SPECTRA [J].
CHAINET, E ;
DERRIEN, J ;
CINTI, RC ;
NGUYEN, TTA ;
DECRESCENZI, M .
JOURNAL DE PHYSIQUE, 1986, 47 (C-8) :209-212
[9]   INCIDENT BEAM EFFECTS IN MEDIUM-ENERGY BACKSCATTERED ELECTRON-DIFFRACTION [J].
CHAMBERS, SA ;
VITOMIROV, IM ;
WEAVER, JH .
PHYSICAL REVIEW B, 1987, 36 (06) :3007-3015
[10]   DIRECT OBSERVATION OF ELASTIC STRAIN AND RELAXATION AT A METAL-METAL INTERFACE BY AUGER-ELECTRON DIFFRACTION - CU/NI(001) [J].
CHAMBERS, SA ;
CHEN, HW ;
VITOMIROV, IM ;
ANDERSON, SB ;
WEAVER, JH .
PHYSICAL REVIEW B, 1986, 33 (12) :8810-8813
123456