INFLUENCES ON SOFT ERROR RATES IN STATIC RAMS

[1] A 35 NS 16K NMOS STATIC RAM [J]. IEEE JOURNAL OF SOLID-STATE CIRCUITS, 1982, 17 (05) : 815 - 820

[2] SOFT ERROR RATE ANALYSIS MODEL (SERAM) FOR DYNAMIC NMOS RAMS [J]. JAPANESE JOURNAL OF APPLIED PHYSICS, 1982, 21 (01) : 73 - 78

[3] A HIGH-PERFORMANCE SENSE AMPLIFIER FOR A 5-V DYNAMIC RAM [J]. IEEE JOURNAL OF SOLID-STATE CIRCUITS, 1980, 15 (05) : 831 - 839

[4] ALPHA-PARTICLE-INDUCED FAILURE MODES IN DYNAMIC RAMS [J]. ELECTRONICS LETTERS, 1985, 21 (01) : 38 - 39

[5] STABILITY AND SER ANALYSIS OF STATIC RAM CELLS [J]. IEEE TRANSACTIONS ON ELECTRON DEVICES, 1985, 32 (02) : 463 - 470

[6] DENT T, 1985, ELECTRON ENG, V57, P51

[7] A FIELD-FUNNELING EFFECT ON THE COLLECTION OF ALPHA-PARTICLE-GENERATED CARRIERS IN SILICON DEVICES [J]. ELECTRON DEVICE LETTERS, 1981, 2 (04): : 103 - 105

[8] HU C, 1982, IEEE ELECTRON DEVICE, V3, P31

[9] MODELING DIFFUSION AND COLLECTION OF CHARGE FROM IONIZING-RADIATION IN SILICON DEVICES [J]. IEEE TRANSACTIONS ON ELECTRON DEVICES, 1979, 26 (11) : 1742 - 1753

[10] MAPPER D, 1981, P INT C SOLID STATE, P815

[1] A 35 NS 16K NMOS STATIC RAM [J]. IEEE JOURNAL OF SOLID-STATE CIRCUITS, 1982, 17 (05) : 815 - 820

[2] SOFT ERROR RATE ANALYSIS MODEL (SERAM) FOR DYNAMIC NMOS RAMS [J]. JAPANESE JOURNAL OF APPLIED PHYSICS, 1982, 21 (01) : 73 - 78

[3] A HIGH-PERFORMANCE SENSE AMPLIFIER FOR A 5-V DYNAMIC RAM [J]. IEEE JOURNAL OF SOLID-STATE CIRCUITS, 1980, 15 (05) : 831 - 839

[4] ALPHA-PARTICLE-INDUCED FAILURE MODES IN DYNAMIC RAMS [J]. ELECTRONICS LETTERS, 1985, 21 (01) : 38 - 39

[5] STABILITY AND SER ANALYSIS OF STATIC RAM CELLS [J]. IEEE TRANSACTIONS ON ELECTRON DEVICES, 1985, 32 (02) : 463 - 470

[6] DENT T, 1985, ELECTRON ENG, V57, P51

[7] A FIELD-FUNNELING EFFECT ON THE COLLECTION OF ALPHA-PARTICLE-GENERATED CARRIERS IN SILICON DEVICES [J]. ELECTRON DEVICE LETTERS, 1981, 2 (04): : 103 - 105

[8] HU C, 1982, IEEE ELECTRON DEVICE, V3, P31

[9] MODELING DIFFUSION AND COLLECTION OF CHARGE FROM IONIZING-RADIATION IN SILICON DEVICES [J]. IEEE TRANSACTIONS ON ELECTRON DEVICES, 1979, 26 (11) : 1742 - 1753

[10] MAPPER D, 1981, P INT C SOLID STATE, P815