ANGLE-RESOLVED MAGNETO-TUNNELING SPECTROSCOPY TO PROBE VALENCE-BAND ANISOTROPY IN SI/SI1-XGEX QUANTUM-WELLS

被引:3
作者
KESAN, VP
GENNSER, U
SYPHERS, DA
SMITH, TP
IYER, SS
机构
[1] MIT,FRANCIS BITTER NATL MAGNET LAB,CAMBRIDGE,MA 02139
[2] BOWDOIN COLL,DEPT PHYS,BRUNSWICK,ME 04011
来源
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B | 1993年 / 11卷 / 03期
关键词
D O I
10.1116/1.586828
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
The resonances of a resonant tunneling structure are probed by a magnetic field applied parallel to the interfaces, which enables us to investigate the local band structure in k space. By rotating the magnetic field in the plane of the interfaces the energy surface at constant k(parallel-to) is investigated. Using this technique differently strained Si/Si1-xGex quantum wells were studied, where with a large anisotropy of the energy levels was seen, with the symmetry axes of light holes and heavy holes being rotated 45-degrees with respect to each other. In the case of resonant tunneling diodes with relaxed Si1-xGex quantum wells grown on thick, relaxed Si1-xGex buffer layers, the anisotropy is smaller, and without complete symmetry between different 90-degrees in-plane directions, which may be due to anisotropic strain relaxation in the Si1-xGex buffer layers.
引用
收藏
页码:1140 / 1144
页数:5
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