THE TEMPERATURE-DEPENDENCE OF THRESHOLD VOLTAGES IN SUBMICROMETER CMOS

被引：18

|

作者：

TZOU, JJ

YAO, CC

CHEUNG, R

CHAN, H

机构：

来源：

IEEE ELECTRON DEVICE LETTERS | 1985年 / 6卷 / 05期

关键词：

D O I：

10.1109/EDL.1985.26114

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

收藏

页码：250 / 252

页数：3

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