THE TEMPERATURE-DEPENDENCE OF THRESHOLD VOLTAGES IN SUBMICROMETER CMOS

被引：18
|
作者：
TZOU, JJ
YAO, CC
CHEUNG, R
CHAN, H
机构：
来源：
IEEE ELECTRON DEVICE LETTERS | 1985年 / 6卷 / 05期
关键词：
D O I：
10.1109/EDL.1985.26114
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
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页码：250 / 252
页数：3
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