SUBHARMONIC FREQUENCY LOCKING IN THE RESISTIVE JOSEPHSON THERMOMETER

被引:5
|
作者
VANVELDHUIZEN, M [1 ]
FOWLER, HA [1 ]
机构
[1] NBS,CTR APPL MATH,GAITHERSBURG,MD 20899
来源
PHYSICAL REVIEW B | 1985年 / 31卷 / 09期
关键词
D O I
10.1103/PhysRevB.31.5805
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
引用
收藏
页码:5805 / 5810
页数:6
相关论文
共 50 条
  • [21] Subharmonic Fourier domain mode locking
    Eigenwillig, Christoph M.
    Wieser, Wolfgang
    Biedermann, Benjamin R.
    Huber, Robert
    OPTICS LETTERS, 2009, 34 (06) : 725 - 727
  • [22] MUTUAL LOCKING, CHAOS AND DEVILS STAIRCASE IN 2 JOSEPHSON TUNNEL-JUNCTIONS WITH A COMMON RESISTIVE SHUNT
    JENSEN, HD
    LARSEN, A
    MYGIND, J
    LEVINSEN, MT
    IEEE TRANSACTIONS ON MAGNETICS, 1989, 25 (02) : 1412 - 1415
  • [23] EFFECT OF RADIOFREQUENCY PUMPING CONDITIONS ON JOSEPHSON GENERATION FREQUENCY IN A RESISTIVE SQUID.
    VASIL'EV, B.V.
    KRIVOI, G.S.
    1982, V 27 (N 2): : 221 - 224
  • [24] SUBHARMONIC INJECTION LOCKING PHENOMENA IN SYNCHRONOUS OSCILLATORS
    POOLE, CR
    ELECTRONICS LETTERS, 1990, 26 (21) : 1748 - 1750
  • [25] SUBHARMONIC STEPS IN IV CHARACTERISTICS OF JOSEPHSON JUNCTIONS
    OVERSON, K
    SOLYMAR, L
    PHYSICS LETTERS A, 1975, 54 (01) : 42 - 44
  • [26] Subharmonic injection-locking balanced oscillator
    Cheong, C
    Leong, J
    Shen, ZX
    MICROWAVE AND OPTICAL TECHNOLOGY LETTERS, 2004, 41 (04) : 306 - 309
  • [27] On resistive nonlocal Josephson electrodynamic
    Silin, VP
    JOURNAL OF EXPERIMENTAL AND THEORETICAL PHYSICS, 1997, 85 (04) : 760 - 766
  • [28] On resistive nonlocal Josephson electrodynamics
    V. P. Silin
    Journal of Experimental and Theoretical Physics, 1997, 85 : 760 - 766
  • [29] LOW-FREQUENCY BEHAVIOR OF COUPLED JOSEPHSON-JUNCTIONS NEAR PHASE LOCKING
    JAIN, AK
    LIKHAREV, KK
    LUKENS, JE
    SAUVAGEAU, JE
    APPLIED PHYSICS LETTERS, 1982, 41 (06) : 566 - 568
  • [30] 4.8 GHz CMOS Frequency Multiplier Using Subharmonic Pulse-Injection Locking for Spurious Suppression
    Takano, Kyoya
    Motoyoshi, Mizuki
    Fujishima, Minoru
    IEICE TRANSACTIONS ON ELECTRONICS, 2008, E91C (11): : 1738 - 1743