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PREDEPOSITION IN SILICON AS AFFECTED BY FORMATION OF ORTHORHOMBIC SIP AND CUBIC SIO-2.P-2O-5 AT PSG-SI INTERFACE
被引:23
作者
:
SOLMI, S
论文数:
0
引用数:
0
h-index:
0
机构:
CNR LAMEL LAB,I-40126 BOLOGNA,ITALY
CNR LAMEL LAB,I-40126 BOLOGNA,ITALY
SOLMI, S
[
1
]
CELOTTI, G
论文数:
0
引用数:
0
h-index:
0
机构:
CNR LAMEL LAB,I-40126 BOLOGNA,ITALY
CNR LAMEL LAB,I-40126 BOLOGNA,ITALY
CELOTTI, G
[
1
]
NOBILI, D
论文数:
0
引用数:
0
h-index:
0
机构:
CNR LAMEL LAB,I-40126 BOLOGNA,ITALY
CNR LAMEL LAB,I-40126 BOLOGNA,ITALY
NOBILI, D
[
1
]
NEGRINI, P
论文数:
0
引用数:
0
h-index:
0
机构:
CNR LAMEL LAB,I-40126 BOLOGNA,ITALY
CNR LAMEL LAB,I-40126 BOLOGNA,ITALY
NEGRINI, P
[
1
]
机构
:
[1]
CNR LAMEL LAB,I-40126 BOLOGNA,ITALY
来源
:
JOURNAL OF THE ELECTROCHEMICAL SOCIETY
|
1976年
/ 123卷
/ 05期
关键词
:
D O I
:
10.1149/1.2132905
中图分类号
:
O646 [电化学、电解、磁化学];
学科分类号
:
081704 ;
摘要
:
引用
收藏
页码:654 / 660
页数:7
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CATALYZED CRYSTALLIZATION IN SIO2 THIN-FILMS
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IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598
IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598
CAMPBELL, DR
[J].
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
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121
(08)
: 1115
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1118
[2]
ARMIGLIATO A, COMMUNICATION
[3]
ARMIGLIATO A, 1975, J MATER SCI, V10, P306
[4]
ELECTRON-MOBILITY EMPIRICALLY RELATED TO PHOSPHORUS CONCENTRATION IN SILICON
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0
引用数:
0
h-index:
0
机构:
UNIV BOLOGNA,FAC ENGN,IST ELECTR,40126 BOLOGNA,ITALY
BACCARANI, G
OSTOJA, P
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0
引用数:
0
h-index:
0
机构:
UNIV BOLOGNA,FAC ENGN,IST ELECTR,40126 BOLOGNA,ITALY
OSTOJA, P
[J].
SOLID-STATE ELECTRONICS,
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: 579
-
580
[5]
CRYSTALLOGRAPHY OF SIP AND SIAS SINGLE CRYSTALS AND OF SIP PRECIPITATES IN SI
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STICKLER, R
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[J].
JOURNAL OF APPLIED PHYSICS,
1966,
37
(13)
: 4683
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&
[6]
PHOSPHORUS DIFFUSION IN PARTIALLY CRYSTALLIZED FILMS OF SIO2
CAMPBELL, DR
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IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598
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[J].
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ARSENIC GLASS SOURCE DIFFUSION IN SI AND SIO2
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GHEZZO, M
BROWN, DM
论文数:
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引用数:
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h-index:
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机构:
GE,CORP RES & DEV,SCHENECTADY,NY 12301
GE,CORP RES & DEV,SCHENECTADY,NY 12301
BROWN, DM
[J].
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
1973,
120
(01)
: 110
-
116
[10]
FORMATION AND COMPOSITION OF SURFACE LAYERS AND SOLUBILITY LIMITS OF PHOSPHORUS DURING DIFFUSION IN SILICON
KOOI, E
论文数:
0
引用数:
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h-index:
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KOOI, E
[J].
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
1964,
111
(12)
: 1383
-
1381
←
1
2
→
共 20 条
[1]
CATALYZED CRYSTALLIZATION IN SIO2 THIN-FILMS
ALESSAND.EI
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598
IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598
ALESSAND.EI
CAMPBELL, DR
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598
IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598
CAMPBELL, DR
[J].
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
1974,
121
(08)
: 1115
-
1118
[2]
ARMIGLIATO A, COMMUNICATION
[3]
ARMIGLIATO A, 1975, J MATER SCI, V10, P306
[4]
ELECTRON-MOBILITY EMPIRICALLY RELATED TO PHOSPHORUS CONCENTRATION IN SILICON
BACCARANI, G
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV BOLOGNA,FAC ENGN,IST ELECTR,40126 BOLOGNA,ITALY
BACCARANI, G
OSTOJA, P
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV BOLOGNA,FAC ENGN,IST ELECTR,40126 BOLOGNA,ITALY
OSTOJA, P
[J].
SOLID-STATE ELECTRONICS,
1975,
18
(06)
: 579
-
580
[5]
CRYSTALLOGRAPHY OF SIP AND SIAS SINGLE CRYSTALS AND OF SIP PRECIPITATES IN SI
BECK, CG
论文数:
0
引用数:
0
h-index:
0
BECK, CG
STICKLER, R
论文数:
0
引用数:
0
h-index:
0
STICKLER, R
[J].
JOURNAL OF APPLIED PHYSICS,
1966,
37
(13)
: 4683
-
&
[6]
PHOSPHORUS DIFFUSION IN PARTIALLY CRYSTALLIZED FILMS OF SIO2
CAMPBELL, DR
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598
IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598
CAMPBELL, DR
ALESSAND.EI
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598
IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598
ALESSAND.EI
TU, KN
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598
IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598
TU, KN
LEWIS, JE
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598
IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598
LEWIS, JE
[J].
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
1974,
121
(08)
: 1081
-
1085
[7]
ANALYSIS OF SURFACE-LAYERS BY CHANNELING TECHNIQUE - BEAM ENERGY-DEPENDENCE
DELLAMEA, G
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV PADUA,IST FIS,UNITA GRP NAZL STRUTTURA MAT,PADUA,ITALY
DELLAMEA, G
DRIGO, AV
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV PADUA,IST FIS,UNITA GRP NAZL STRUTTURA MAT,PADUA,ITALY
DRIGO, AV
LORUSSO, S
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV PADUA,IST FIS,UNITA GRP NAZL STRUTTURA MAT,PADUA,ITALY
LORUSSO, S
MAZZOLDI, P
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV PADUA,IST FIS,UNITA GRP NAZL STRUTTURA MAT,PADUA,ITALY
MAZZOLDI, P
YAMAGUCHI, S
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV PADUA,IST FIS,UNITA GRP NAZL STRUTTURA MAT,PADUA,ITALY
YAMAGUCHI, S
BENTINI, GG
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV PADUA,IST FIS,UNITA GRP NAZL STRUTTURA MAT,PADUA,ITALY
BENTINI, GG
[J].
APPLIED PHYSICS LETTERS,
1975,
26
(04)
: 147
-
150
[8]
CHEMICAL VAPOR-DEPOSITION OF PHOSPHOSILICATE GLASSES FROM MIXTURES OF SIH4, O2, AND POCI3
GHEZZO, M
论文数:
0
引用数:
0
h-index:
0
GHEZZO, M
[J].
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
1972,
119
(10)
: 1428
-
&
[9]
ARSENIC GLASS SOURCE DIFFUSION IN SI AND SIO2
GHEZZO, M
论文数:
0
引用数:
0
h-index:
0
机构:
GE,CORP RES & DEV,SCHENECTADY,NY 12301
GE,CORP RES & DEV,SCHENECTADY,NY 12301
GHEZZO, M
BROWN, DM
论文数:
0
引用数:
0
h-index:
0
机构:
GE,CORP RES & DEV,SCHENECTADY,NY 12301
GE,CORP RES & DEV,SCHENECTADY,NY 12301
BROWN, DM
[J].
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
1973,
120
(01)
: 110
-
116
[10]
FORMATION AND COMPOSITION OF SURFACE LAYERS AND SOLUBILITY LIMITS OF PHOSPHORUS DURING DIFFUSION IN SILICON
KOOI, E
论文数:
0
引用数:
0
h-index:
0
KOOI, E
[J].
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
1964,
111
(12)
: 1383
-
1381
←
1
2
→