Evaluation of Fault Tolerance in Cloud Computing using Colored Petri Nets

被引:0
作者
Effatparvar, Mehdi [1 ]
Madani, Seyedeh Solmaz [2 ]
机构
[1] Islamic Azad Univ, Ardabil Branch Ardabil, Sama Tech & Vocat Training Coll, Ardebil, Iran
[2] Islamic Azad Univ, Dept Comp & Informat Engn, Ardebil, Iran
关键词
Cloud Computing; Fault Tolerance; Colored Petri Nets; Reliability;
D O I
暂无
中图分类号
TP301 [理论、方法];
学科分类号
081202 ;
摘要
Nowadays, the necessity of rendering reliable services to the customers in business markets is assumed as a crucial matter for the service providers, and the importance of this subject in many fields is undeniable. Design of systems with high complexity and existence of different resources in network cloud leads the service providers to intend to provide the best services to their customers. One of the important challenges for service providers is fault tolerance and reliability and different techniques and methods have been presented for solving this challenge so far. The method presented in this paper analyzes the fault tolerance process in interconnected network cloud in order to avoid problems and irreparable damages before implementation. In the offered method, the fault tolerance was evaluated aiding colored petri nets using Byzantine technique. Summary of results analyzed by cpntools and demonstrated reliability. It was concluded that upon increase of requests, the fault tolerance is reduced and consequently reliability is also reduced and vice versa. In other word, resources management is under impact of requested services.
引用
收藏
页码:340 / 346
页数:7
相关论文
共 17 条
[1]  
AFZAL A, 2008, J FUTURE GENERATION, V24, P404, DOI DOI 10.1016/J.FUTURE.2007.07.004
[2]  
Cruz-Chavez MA, 2010, COMM COM INF SC, V78, P1
[3]  
Asgharpour M. J., 2011, MULTICRITERIA DECISI
[4]  
BenDaly Hlaoui Y., 2008, AUPC 08
[5]   Definition, modelling and simulation of a grid computing scheduling system for high throughput computing [J].
Caron, Eddy ;
Garonne, Vincent ;
Tsaregorodtsev, Andrei .
FUTURE GENERATION COMPUTER SYSTEMS-THE INTERNATIONAL JOURNAL OF ESCIENCE, 2007, 23 (08) :968-976
[6]  
Chen RM, 2009, LECT NOTES ARTIF INT, V5755, P242, DOI 10.1007/978-3-642-04020-7_26
[7]  
Dai Y.S., 2007, IEEE T RELIABILITY, V56
[8]  
Entezari Maleki Reza, 2009, 14 ANN C IR COMP ASS
[9]  
Etminani Kobra, 2007, THESIS
[10]  
Farjaminejad F, 2014, INT J COMPUTER APPL, V3, P73