ELECTROTHERMAL ATOMIC-EMISSION SPECTROMETRY

被引:6
作者
BAXTER, DC
FRECH, W
机构
[1] Department of Analytical Chemistry, Umeå University
关键词
D O I
10.1016/0584-8547(94)00145-L
中图分类号
O433 [光谱学];
学科分类号
0703 ; 070302 ;
摘要
[No abstract available]
引用
收藏
页码:655 / 706
页数:52
相关论文
共 168 条
[71]  
KATSKOV DA, 1982, ZH PRIKL SPEKTROSK, V36, P222
[72]   SOME CHARACTERISTICS OF A COMMERCIAL ECHELLE SPECTROMETER [J].
KAWAGUCHI, H ;
YOSHIMURA, K ;
MIZUIKE, A .
SPECTROCHIMICA ACTA PART B-ATOMIC SPECTROSCOPY, 1986, 41 (03) :295-300
[73]  
KHAMMAS ZA, 1985, MIKROCHIM ACTA, V1, P333, DOI 10.1007/BF01201529
[74]   EFFECT OF MODULATION WAVE FORM ON UTILITY OF EMISSION BACKGROUND CORRECTIONS OBTAINED WITH AN OSCILLATING REFRACTOR PLATE [J].
KOIRTYOHANN, SR ;
GLASS, ED ;
YATES, DA ;
HINDERBERGER, EJ ;
LICHTE, FE .
ANALYTICAL CHEMISTRY, 1977, 49 (08) :1121-1126
[75]  
KOVACS Z, 1986, MAGY KEM FOLY, V92, P187
[76]  
L'VOV B.V., 1977, ZH PRIKL SPEKTROSK, V27, P395
[77]  
L'vov B.V., 1987, ZH PRIKL SPEKTROSK, V46, P7
[78]  
LANGMYHR FJ, 1985, PROG ANAL ATOM SPECT, V8, P193
[79]  
LAWSON SR, 1983, PROG ANAL AT SPECTRO, V6, P49
[80]   TIME-DEPENDENT CALIBRATION GRAPHS IN ELECTROTHERMAL ATOMIZATION ATOMIC EMISSION-SPECTROMETRY [J].
LEYON, RE ;
HOLCOMBE, JA .
ANALYST, 1989, 114 (01) :61-65