SIMPLE EXTENSION TO THE FABRY-PEROT TECHNIQUE FOR ACCURATE MEASUREMENT OF LOSSES IN SEMICONDUCTOR WAVE-GUIDES

被引：15
作者：
CLARK, DF
IQBAL, MS
机构：
[1] Department of Electronic and Electrical Engineering, University of Strathclyde, Glasgow, GI 1XW
来源：
OPTICS LETTERS | 1990年 / 15卷 / 22期
关键词：
D O I：
10.1364/OL.15.001291
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
A simple modification to the Fabry-Perot technique for the measurement of semiconductor waveguide losses is described. The modification dispenses with the need for knowing implicitly the reflectivities of end faces of the waveguide, which are usually difficult to ascertain experimentally. © 1990 Optical Society of America.
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页码：1291 / 1293
页数：3
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