QUANTITATIVE-ANALYSIS OF TRACE AND MAJOR ELEMENTS IN THIN-SECTIONS OF SOILS WITH THE SECONDARY ION-MICROSCOPE (CAMECA)

被引：8

作者：

BISDOM, EBA

HENSTRA, S

WERNER, HW

BOUDEWIJN, PR

KNIPPENBERG, WF

DEGREFTE, HAM

GOURGOUT, JM

MIGEON, HN

机构：

[1] TECH & PHYS ENGN RES SERV,6700 AJ WAGENINGEN,NETHERLANDS

[2] PHILIPS RES LABS,5600 MD EINDHOVEN,NETHERLANDS

[3] CAMECA,F-92403 COURBEVOIE,FRANCE

来源：

GEODERMA | 1983年 / 30卷 / 1-4期

关键词：

D O I：

10.1016/0016-7061(83)90060-5

中图分类号：

S15 [土壤学];

学科分类号：

0903 ; 090301 ;

摘要：

引用

页码：117 / 134

页数：18

共 15 条

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ANDERSEN, CA ;

HINTHORNE, JR .

ANALYTICAL CHEMISTRY, 1973, 45 (08) :1421-1438

[2]

Bisdom E. B. A., 1981, Submicroscopy of Soils and Weathered Rocks. 1st Workshop of the International Working-Group on Submicroscopy of Undisturbed Soil Materials (IWGSUSM) 1980, Wageningen, The Netherlands, P117

[3]

BISDOM EBA, 1977, NETH J AGR SCI, V25, P1

[4]

BISDOM EBA, 1981, NETH J AGR SCI, V29, P23

[5]

Henstra S., 1981, Submicroscopy of Soils and Weathered Rocks. 1st Workshop of the International Working-Group on Submicroscopy of Undisturbed Soil Materials (IWGSUSM) 1980, Wageningen, The Netherlands, P55

[6]

HENSTRA S, 1980, ELECTRON MICROS, V3, P224

[7]

Jongerius A., 1975, 10 NETH SOIL SURV I

[8]

KNIPPENBERG WF, 1974, PHILIPS TECH REV, V34, P298

[9]

Morgan A. E., 1980, Surface and Interface Analysis, V2, P123, DOI 10.1002/sia.740020402

[10] TEST OF A QUANTITATIVE APPROACH TO SECONDARY ION MASS-SPECTROMETRY ON GLASS AND SILICATE STANDARDS [J].

MORGAN, AE ;

WERNER, HW .

ANALYTICAL CHEMISTRY, 1977, 49 (07) :927-931

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