首页
学术期刊
论文检测
AIGC检测
热点
更多
数据
VISUALIZATION OF FINGERPRINTS IN SCANNING ELECTRON-MICROSCOPE
被引:4
|
作者
:
GARNER, GE
论文数:
0
引用数:
0
h-index:
0
机构:
WASHINGTON STATE UNIV, ELECTR MICROSCOPE CTR, PULLMAN, WA 99163 USA
GARNER, GE
FONTAN, CR
论文数:
0
引用数:
0
h-index:
0
机构:
WASHINGTON STATE UNIV, ELECTR MICROSCOPE CTR, PULLMAN, WA 99163 USA
FONTAN, CR
HOBSON, DW
论文数:
0
引用数:
0
h-index:
0
机构:
WASHINGTON STATE UNIV, ELECTR MICROSCOPE CTR, PULLMAN, WA 99163 USA
HOBSON, DW
机构
:
[1]
WASHINGTON STATE UNIV, ELECTR MICROSCOPE CTR, PULLMAN, WA 99163 USA
[2]
WASHINGTON STATE UNIV, DEPT POLICE SCI & ADM, PULLMAN, WA 99163 USA
来源
:
JOURNAL OF THE FORENSIC SCIENCE SOCIETY
|
1975年
/ 15卷
/ 04期
关键词
:
D O I
:
10.1016/S0015-7368(75)71000-9
中图分类号
:
DF [法律];
D9 [法律];
R [医药、卫生];
学科分类号
:
0301 ;
10 ;
摘要
:
引用
收藏
页码:281 / 288
页数:8
相关论文
共 50 条
[31]
ELECTRON-SPECTROSCOPY IN THE SCANNING ELECTRON-MICROSCOPE
SEILER, H
论文数:
0
引用数:
0
h-index:
0
SEILER, H
ULTRAMICROSCOPY,
1985,
17
(01)
: 1
-
8
[32]
AN INTRODUCTION TO PROCESS VISUALIZATION CAPABILITIES AND CONSIDERATIONS IN THE ENVIRONMENTAL SCANNING ELECTRON-MICROSCOPE (ESEM)
PRACK, ER
论文数:
0
引用数:
0
h-index:
0
机构:
Motorola, Advanced Package Development and Prototype Labs, Microprocessor and Memory Technologies Group, Austin, Texas
PRACK, ER
MICROSCOPY RESEARCH AND TECHNIQUE,
1993,
25
(5-6)
: 487
-
492
[33]
ELECTRON CHANNELING PATTERNS IN THE SCANNING ELECTRON-MICROSCOPE
JOY, DC
论文数:
0
引用数:
0
h-index:
0
机构:
NBS, WASHINGTON, DC 20234 USA
JOY, DC
NEWBURY, DE
论文数:
0
引用数:
0
h-index:
0
机构:
NBS, WASHINGTON, DC 20234 USA
NEWBURY, DE
DAVIDSON, DL
论文数:
0
引用数:
0
h-index:
0
机构:
NBS, WASHINGTON, DC 20234 USA
DAVIDSON, DL
JOURNAL OF APPLIED PHYSICS,
1982,
53
(08)
: R81
-
R122
[34]
HUMAN LUNG IN SCANNING ELECTRON-MICROSCOPE
GEHR, P
论文数:
0
引用数:
0
h-index:
0
机构:
ANAT INST,BERN,SWITZERLAND
ANAT INST,BERN,SWITZERLAND
GEHR, P
ACTA ANATOMICA,
1976,
95
(01):
: 160
-
160
[35]
SCANNING ELECTRON-MICROSCOPE AS AN ANALYTICAL TOOL
PEASE, DE
论文数:
0
引用数:
0
h-index:
0
机构:
ETEC CORP,3392 INVESTMENT BLVD,HAYWARD,CA 94545
ETEC CORP,3392 INVESTMENT BLVD,HAYWARD,CA 94545
PEASE, DE
DAO, J
论文数:
0
引用数:
0
h-index:
0
机构:
ETEC CORP,3392 INVESTMENT BLVD,HAYWARD,CA 94545
ETEC CORP,3392 INVESTMENT BLVD,HAYWARD,CA 94545
DAO, J
IEEE TRANSACTIONS ON NUCLEAR SCIENCE,
1974,
NS21
(01)
: 788
-
793
[36]
SCANNING ELECTRON-MICROSCOPE AND ITS APPLICATION
RAMPLEY, DN
论文数:
0
引用数:
0
h-index:
0
RAMPLEY, DN
MEASUREMENT AND CONTROL,
1975,
8
(08):
: 324
-
333
[37]
ROBUST MICROMANIPULATOR FOR SCANNING ELECTRON-MICROSCOPE
PAWLEY, JB
论文数:
0
引用数:
0
h-index:
0
机构:
UCL, DEPT ANAT & EMBRYOL, LONDON WC1E 6BT, ENGLAND
UCL, DEPT ANAT & EMBRYOL, LONDON WC1E 6BT, ENGLAND
PAWLEY, JB
BOYDE, A
论文数:
0
引用数:
0
h-index:
0
机构:
UCL, DEPT ANAT & EMBRYOL, LONDON WC1E 6BT, ENGLAND
UCL, DEPT ANAT & EMBRYOL, LONDON WC1E 6BT, ENGLAND
BOYDE, A
JOURNAL OF MICROSCOPY,
1975,
103
(MAR)
: 265
-
270
[38]
GIGAHERTZ STROBOSCOPY WITH SCANNING ELECTRON-MICROSCOPE
HOSOKAWA, T
论文数:
0
引用数:
0
h-index:
0
HOSOKAWA, T
FUJIOKA, H
论文数:
0
引用数:
0
h-index:
0
FUJIOKA, H
URA, K
论文数:
0
引用数:
0
h-index:
0
URA, K
REVIEW OF SCIENTIFIC INSTRUMENTS,
1978,
49
(09)
: 1293
-
1299
[39]
TEST OBJECT FOR A SCANNING ELECTRON-MICROSCOPE
SMIRNOV, YS
论文数:
0
引用数:
0
h-index:
0
SMIRNOV, YS
VASICHEV, BN
论文数:
0
引用数:
0
h-index:
0
VASICHEV, BN
SKORODUMOVA, AA
论文数:
0
引用数:
0
h-index:
0
SKORODUMOVA, AA
SOVIET JOURNAL OF OPTICAL TECHNOLOGY,
1984,
51
(02):
: 113
-
115
[40]
PREPARATION OF POLLEN FOR SCANNING ELECTRON-MICROSCOPE
LYNCH, SP
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV CALIF,DEPT BOT,DAVIS,CA 95616
UNIV CALIF,DEPT BOT,DAVIS,CA 95616
LYNCH, SP
WEBSTER, GL
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV CALIF,DEPT BOT,DAVIS,CA 95616
UNIV CALIF,DEPT BOT,DAVIS,CA 95616
WEBSTER, GL
AMERICAN JOURNAL OF BOTANY,
1974,
61
(05)
: 59
-
59
←
1
2
3
4
5
→