ON THE IDENTIFICATION OF THE SULFUR OXIDATION-STATE IN INORGANIC SODIUM SULFOXY SALTS BY LASER MICROPROBE MASS ANALYSIS AND SECONDARY ION MASS-SPECTROMETRY

被引：5
作者：
MARIEN, J
DEPAUW, E
机构：
来源：
ANALYTICAL CHEMISTRY | 1985年 / 57卷 / 01期
关键词：
D O I：
10.1021/ac00279a081
中图分类号：
O65 [分析化学];
学科分类号：
070302 ; 081704 ;
摘要：
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页码：361 / 364
页数：4
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共 11 条
[1]   MOLECULAR ION DISTRIBUTIONS IN LASER MICROPROBE MASS-SPECTROMETRY OF CALCIUM-OXIDE AND CALCIUM SALTS [J].
BRUYNSEELS, FJ ;
VANGRIEKEN, RE .
SPECTROCHIMICA ACTA PART B-ATOMIC SPECTROSCOPY, 1983, 38 (5-6) :853-858
[2]   LASER MICROPROBE MASS-SPECTROMETRIC IDENTIFICATION OF SULFUR SPECIES IN SINGLE MICROMETER-SIZE PARTICLES [J].
BRUYNSEELS, FJ ;
VANGRIEKEN, RE .
ANALYTICAL CHEMISTRY, 1984, 56 (06) :871-873
[3]  
DEPAUW E, 1980, B SOC CHIM BELG, V89, P83
[4]  
DEPAUW E, 1981, THESIS U LIEGE
[5]  
DEPAUW E, 1982, INT J MASS SPECTROM, V43, P233
[6]  
DEPAUW E, 1979, SPRINGER SERIES CHEM, V9, P139
[7]   SIMS MOLECULAR CLUSTER INTENSITIES OF INORGANIC SALTS CONTAINING SULFUR AND NITROGEN OXYANIONS [J].
GANJEI, JD ;
COLTON, RJ ;
MURDAY, JS .
INTERNATIONAL JOURNAL OF MASS SPECTROMETRY AND ION PROCESSES, 1981, 37 (01) :49-65
[8]  
MARIEN J, 1979, B SOC CHIM BELG, V88, P115
[9]   EJECTION DYNAMICS AND ELECTRONIC PROCESSES GOVERNING SECONDARY PARTICLE-EMISSION IN SIMS [J].
MURRAY, PT ;
RABALAIS, JW .
JOURNAL OF THE AMERICAN CHEMICAL SOCIETY, 1981, 103 (05) :1007-1013
[10]   EMPIRICAL FORMULA FOR CALCULATION OF SECONDARY ION YIELDS FROM OXIDIZED METAL-SURFACES AND METAL-OXIDES [J].
PLOG, C ;
WIEDMANN, L ;
BENNINGHOVEN, A .
SURFACE SCIENCE, 1977, 67 (02) :565-580
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