CHARACTERIZATION OF INSULATORS BY HIGH-RESOLUTION ELECTRON-ENERGY-LOSS SPECTROSCOPY - APPLICATION OF A SURFACE-POTENTIAL STABILIZATION TECHNIQUE

被引:103
作者
LIEHR, M [1 ]
THIRY, PA [1 ]
PIREAUX, JJ [1 ]
CAUDANO, R [1 ]
机构
[1] FAC UNIV NOTRE DAME PAIX,INST RECH INTERFACES SOLIDES,SPECT ELECTR LAB,B-5000 NAMUR,BELGIUM
来源
PHYSICAL REVIEW B | 1986年 / 33卷 / 08期
关键词
D O I
10.1103/PhysRevB.33.5682
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
引用
收藏
页码:5682 / 5697
页数:16
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