AN ANALYTICAL ELECTRON-MICROSCOPE EXAMINATION OF SENSITIZED ALSI-430 STAINLESS-STEEL

被引：6

作者：

LEE, JB ^{[1
]}

SMITH, JF ^{[1
]}

GEIGER, AL ^{[1
]}

KAH, DH ^{[1
]}

机构：

[1] REPUBL STEEL CORP,CLEVELAND,OH

来源：

CORROSION | 1985年 / 41卷 / 02期

关键词：

D O I：

10.5006/1.3581975

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：76 / 80

页数：5

共 12 条

[1]

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[2]

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[3]

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[4]

Goldstein JI, 1977, SCANNING ELECTRON MI, V1, P315

[5] DETERMINATION OF FOIL THICKNESS BY SCANNING-TRANSMISSION ELECTRON-MICROSCOPY [J].

KELLY, PM ;

JOSTSONS, A ;

BLAKE, RG ;

NAPIER, JG .

PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1975, 31 (02) :771-780

[6]

KINZEL AB, 1973, T AIME, V194, P337

[7] MODIFICATION OF THE ASTM STANDARD FERRIC SULFATE-SULFURIC ACID TEST AND COPPER-COPPER SULFATE-SULFURIC ACID TEST FOR DETERMINING THE DEGREE OF SENSITIZATION OF FERRITIC STAINLESS-STEELS [J].

LEE, JB .

CORROSION, 1983, 39 (12) :469-474

[8] DIRECT EVIDENCE OF CHROMIUM DEPLETION NEAR GRAIN-BOUNDARIES IN SENSITIZED STAINLESS-STEELS [J].

PANDE, CS ;

SUENAGA, M ;

VYAS, B ;

ISAACS, HS ;

HARLING, DF .

SCRIPTA METALLURGICA, 1977, 11 (08) :681-684

[9]

Peckner D., 1977, HDB STAINLESS STEEL

[10]

Rao P., 1979, ASTM STP, V672, P321

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