METHOD OF MEASURING THE THERMOELECTRICAL CHARACTERISTICS OF SEMICONDUCTORS AT HIGH-TEMPERATURES

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作者：

GLAZOV, VM

AIVAZOV, AA

SHTERN, YI

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来源：

INDUSTRIAL LABORATORY | 1981年 / 47卷 / 03期

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中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

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页码：262 / 265

页数：4

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