A NOVEL X-RAY-SCATTERING DIFFRACTOMETER FOR STUDYING SURFACE-STRUCTURES UNDER UHV CONDITIONS

被引：67
作者：
BRENNAN, S [1 ]
EISENBERGER, P [1 ]
机构：
[1] EXXON RES & ENGN CO,LINDEN,NJ 07036
来源：
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT | 1984年 / 222卷 / 1-2期
关键词：
D O I：
10.1016/0167-5087(84)90521-0
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
引用
收藏
页码：164 / 167
页数：4
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